- Docente: Carla Martini
- Credits: 5
- SSD: ING-IND/21
- Language: English
- Teaching Mode: Traditional lectures
- Campus: Bologna
- Corso: Second cycle degree programme (LM) in Advanced spectroscopy in chemistry (cod. 0885)
Course contents
PART I: ELECTRON MICROSCOPY
IntroductionIntroduction to Electron Microscopy: a brief history.
Electron opticsElectron beam generation: thermoionic (W and LaB6) and field emission guns, cathode comparison.
Electron beam lenses and apertures. Beam alignment, deflections and aberrations.
Electron beam / specimen interactionsInteraction volume: influence of beam and specimen parameters. Secondary electron emissions, transmitted electrons, induced specimen current, backscattered electron emission, Auger electron emission, X-ray emission.
Image formation and interpretationImage construction: secondary (SE), backscattered (BSE) and transmitted (TE) electrons. Detectors, compositional and topographic contrast formation, image quality. Variable pressure and environmental electron scanning microscopy. Electron backscattering diffraction (EBSD).
Elemental analysisGeneration of X-rays. Spectral measurements: Energy dispersive and wavelength dispersive spectrometers (EDS, WDS). Qualitative and quantitative analyses. X-ray mapping and line scan.
PART II: MICROSCOPIC AND SPECTROSCOPIC IMAGING
Raman MicroscopyA brief history of the Raman effect, classical and quantum-mechanical description.
Polarisation, Raman resonance, fluorescence, confocality.
Instrumentation: Dispersive and FT spectrometers, coupling microscope-spectrometer.
IR MicroscopyA brief history and fundamentals of infrared spectroscopy.
Instrumentation: double beam IR spectrometer, FT-IR spectrometer, coupling microscope-spectrometer.
IR techniques: transmission, reflection, near-normal reflection absorption, ATR.
XRF MicroscopyA brief history and fundamentals of X-Ray fluorescence.
Instrumentation: device structure, X-Ray generation, detectors, sample chamber, coupling microscope-spectrometer.
Qualitative and quantitative analyses, confocality.
Imaging SpectroscopyDirect imaging, series imaging, signal-to-noise ratio (S/N) and collection time .
Raman imaging (line scanning, mapping, confocal imaging); IR imaging; Fluorescence imaging.
Quantitative chemical distribution, surface topology.
PART III: COUPLED TECHNIQUES AND APPLICATIONS TO MATERIALS SCIENCE
Imaging and analyses by coupling of Raman Spectroscopy, Energy Dispersive Spectroscopy and Scanning Electron Microscopy.
Sample preparation : metals, ceramics, minerals, semiconductors, polymers (film and membranes, resins and plastics), biological materials.Applications and case studies.
Readings/Bibliography
Course material (slides and notes).
- Goldstein et al., Scanning Electron Microscopy and X-Ray Microanalysis, Kluwer Academic, 2003
- Handbook of Vibrational Spectroscopy (ed. by J.M. Chalmers, P.R: Griffiths) J.Wiley, 2002
- J.M. Hollas, Modern Spectroscopy, J.Wiley & Sons, 1992
Teaching methods
Lectures and practicals according to the timetable.
Assessment methods
Oral examination .
Teaching tools
PC and projector, blackboard. Access to research labs (SEM/EDS+Raman; IR)
Office hours
See the website of Carla Martini