85734 - Test, Diagnosis and Reliability M

Course Unit Page

Academic Year 2019/2020

Learning outcomes

The course will first address the problem of fault modeling, with reference to the automotive environment, to then study testing, design for testability and hardware in the loop approaches. Then, onboard monitoring and diagnosis will be addressed, to finally study fault tolerant techniques for reliable systems’ design. The course will include laboratory experiences, and possible seminars given by experts in the field from the industrial world.

Course contents

Introduction to Digital Circuit and Systems' Testing

  • Definitions and motivations
  • Position within the VLSI process
  • Yield and production cost of an IC
  • Some example of testing process: Characterization Testing; Manufacturing Testing; Burn-in; Incoming Inspection

Fault Models

  • Stuck-At Faults (SAs): Basics on Testing for SAs
  • Fault Equivalence and Fault Collapsing
  • Checkpoint Theorem
  • Fault Dominance and Fault Collapsing
  • Stuck-Open Faults: Possible Testing
  • Stuck-On Faults: Possible Testing
  • Bridging Faults, Delay Faulrts, Crosstalk Faults and Transient Faults: Possible Testing

Automatic Test Pattern Generation (ATPG)

  • Definition
  • ATPG Algebras
  • Exhaustive Algorithms
  • Random Algorithms
  • Path Sensitization
  • Fault Coverage and Test Efficiency

Automatic Test Equipment (ATE)

  • Components and Specification
  • Cost

Fault Diagnosis

  • Definitions and Motivations
  • Fault Dictionary
  • Diagnostic Tree

Design for Testability (DFT) Techniques and Hardware in the Loop Approaches

  • Introduction
  • Ad-Hoc and Structural Methods
  • Full Scan
  • Partial Scan
  • Boundary Scan
  • Built-In-Self Test (BIST)
  • Built-In-Logic-Block-Observer (BILBO)
  • Hardware in the loop approaches

Fault-Tolerant Techniques

  • Introduction: Motivations; Applications
  • Modular Redundancy: Basic Strategy; Voter Design and Reliability; Common Mode Failures; Diagnosis of Faulty Modules
  • On-Line Testing and Recovery: Duplication and Comparison; Self Checking Circuits
  • Self-Checking Circuits: Properties; Fault Hypothesis; Design of Self Checking Functional Blocks; Design of Checkers; Error Indicators
  • Error Detecting Codes: Berger Codes (Theory and Checker Design); Parity Codes (Theory and Checker Design); m-out-of-n Codes (Theory and Checker Design)
  • Recovery Techniques: Roll Back and Retry; Reconfiguration
  • Error Correcting Codes: Introduction to Linear Parity Check Codes; Single Error Correction Hamming Codes; Single Error Correction/Double Error Detection Hsiao Codes; Encoding and Decoding Circuits

The course includes practice sessions in laboratories on:

  • Electrical level simulations of resistive bridging faults, crosstalk faults and transient faults, and analysis of their effects in some circuits of interest
  • Design of basic components usually employed in high reliability systems and their prototyping by means of FPGA


J. Segura C. F. Hawkins, “CMOS Electronics – How It Works, How It Fails” IEEE Press – Wiley, 2004.

M. L. Bushnell, V. D. Agrawal, “Essential of Electronic Testing”, Kluwer Academic Publishers, 2000

M. Abramovici, M. A. Bruer, A. D. Friedman, “Digital Systems Testing and Testable Design”, Computer Science Press, 1990

S. Mourad, Y. Zorian, “Principles of Testing Electronic Systems”, Essential of Electronic Testing”,Wiley, 2000

N. K. Jha, S. Kundu, “Testing and Reliable Design of CMOS Circuits”, Kluwer Academic Publishers, 1990

P. K. Lala, “Self-Checking and Fault Tolerant Digital Design”, Morgan Caufmann Publ, 2001

Teaching methods

Lessons and computer practice.

Assessment methods

Written/Oral exam

Teaching tools

PC, projector, Power Point slides.

Office hours

See the website of Cecilia Metra