Santarelli, Alberto; Cignani, Rafael; Niessen, Daniel; Gibiino, Gian Piero; Traverso, Pier Andrea; Schreurs, Dominique; Filicori, Fabio, Multi-bias nonlinear characterization of GaN FET trapping effects through a multiple pulse time domain network analyzer, in: European Microwave Week 2015:, Institute of Electrical and Electronics Engineers Inc., 2015, pp. 81 - 84 (atti di: 10th European Microwave Integrated Circuits Conference, EuMIC 2015, fra, 2015) [Contribution to conference proceedings]
Alberto Santarelli;Rafael Cignani;Gian Piero Gibiino;Daniel Niessen;Pier Andrea Traverso;Corrado Florian;Dominique M. M. -P. Schreurs;Fabio Filicori, A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2014, 24, pp. 132 - 134 [Scientific article]
Santarelli, Alberto; Cignani, Rafael; Niessen, Daniel; Gibiino, Gian Piero; Traverso, Pier Andrea; Di Giacomo, Valeria; Chang, Christophe; Floriot, Didier; Schreurs, Dominique; Filicori, Fabio, Evaluation of GaN FET power performance reduction due to nonlinear charge trapping effects, in: European Microwave Week 2014: "Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 2014, pp. 198 - 201 (atti di: 9th European Microwave Integrated Circuits Conference, EuMIC 2014 - Held as Part of the 17th European Microwave Week, EuMW 2014, Fiera di Roma, ita, 2014) [Contribution to conference proceedings]
Paolo Magnone;Pier Andrea Traverso;Giacomo Barletta;Claudio Fiegna, Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment, «MEASUREMENT», 2014, 52, pp. 47 - 54 [Scientific article]
Alberto Santarelli;Daniel Niessen;Rafael Cignani;Gian Piero Gibiino;Pier Andrea Traverso;Corrado Florian;Dominique M. M.-P. Schreurs;Fabio Filicori, GaN FET Nonlinear Modeling Based on Double Pulse I/V Characteristics, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2014, Volume: 62 , Issue: 12 , Part: 2, pp. 3262 - 3273 [Scientific article]
A. Santarelli;D. Niessen;R. Cignani;G. P. Gibiino;P. A. Traverso;C. Florian;D. Schreurs;F. Filicori, Large-signal GaN transistor characterization and modeling including charge trapping nonlinear dynamics, in: Proceedings of 2014 IEEE MTT-S International Microwave Symposium (IMS2014), 2014, pp. 1 - 3 (atti di: 2014 IEEE MTT-S International Microwave Symposium (IMS2014), Tampa (FL) USA, 1-6 June, 2014) [Contribution to conference proceedings]
P. Magnone; P. A. Traverso; C. Fiegna, Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Device, in: 19th Symposium IMEKO, 2014, pp. 1046 - 1051 (atti di: 19th Symposium IMEKO, Benevento, September 15 - 17, 2014) [Contribution to conference proceedings]
P. Magnone;G. Barletta;P.A. Traverso;A. Magri;E. Sangiorgi;C. Fiegna, Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), in: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), Institute of Electrical and Electronics Engineers Inc., 2014, pp. 163 - 166 (atti di: International Symposium on Power Semiconductor Devices and ICs, Waikoloa, HI, 15-19 June 2014) [Contribution to conference proceedings]
Corrado Florian;Pier Andrea Traverso;Alberto Santarelli;Fabio Filicori, An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices, «IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT», 2013, 62, pp. 2857 - 2869 [Scientific article]
Paolo Magnone; Pier Andrea Traverso; Giacomo Barletta; Claudio Fiegna, Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide, in: 19 th Symposium IMEKO TC 4 Symposium and 17th IWADC Workshop Advances in Instrumentation and Sensors Interoperability, 2013, pp. 240 - 245 (atti di: 19 th Symposium IMEKO TC 4 Symposium and 17th IWADC Workshop Advances in Instrumentation and Sensors Interoperability, Barcelona, Spain, July 18-19, 2013) [Contribution to conference proceedings]
A. Santarelli;R. Cignani;G.P. Gibiino;D. Niessen;P.A. Traverso;C. Florian;C. Lanzieri;A. Nanni;D. Schreurs;F. Filicori, Nonlinear charge trapping effects on pulsed I/V characteristics of GaN FETs, in: Proceedings of the 8th European Microwave Integrated Circuits Conference, EuMIC 2013, London, HORIZON HOUSE PUBLICATIONS INC, 2013, pp. 404 - 407 (atti di: European Microwave Integrated Circuits Conference, EuMIC 2013, Nuremberg, 2013) [Contribution to conference proceedings]
A. Santarelli;R. Cignani;G. b. Gibiino;D. Niessen;P. Traverso;C. Florian;C. Lanzieri;A. Nanni;D. Schreurs;F. Filicori, Nonlinear charge trapping effects on pulsed I/V characteristics of GaN FETs, in: Proceedings of 43rd European Microwave Conference, EuMC 2013, Nuremberg, 2013, pp. 1375 - 1378 (atti di: 43rd European Microwave Conference, EuMC 2013, Nuremberg, 2013) [Contribution to conference proceedings]
Alberto Santarelli;Rafael Cignani;Daniel Niessen;Pier Andrea Traverso;Fabio Filicori, New pulsed measurement setup for GaN and GaAs FETs characterization, «INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES», 2012, 4, pp. 387 - 397 [Scientific article]
P.A. Traverso; M. Salami; G. Pasini; F. Filicori, Non-linear dynamic modelling of broad-band GHz-field Analogue-to-Digital acquisition channels, «MEASUREMENT», 2012, 45, pp. 2529 - 2538 [Scientific article]
A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori, A Dual-Source Nonlinear Measurement System Oriented to the Empirical Characterization of Low-Frequency Dispersion in Microwave Electron Devices, «COMPUTER STANDARDS & INTERFACES», 2011, 33, pp. 165 - 175 [Scientific article]
