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Pier Andrea Traverso

Professore associato

Dipartimento di Ingegneria dell'Energia Elettrica e dell'Informazione "Guglielmo Marconi"

Settore scientifico disciplinare: ING-INF/07 MISURE ELETTRICHE E ELETTRONICHE

Pubblicazioni

A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori, A Dual-Source Nonlinear Measurement System Oriented to the Empirical Characterization of Low-Frequency Dispersion in Microwave Electron Devices, «COMPUTER STANDARDS & INTERFACES», 2011, 33, pp. 165 - 175 [articolo]

C. Florian; P.A. Traverso; M. Feudale; F. Filicori, A C-band GaAs-pHEMT MMIC low phase noise VCO for space applications using a new cyclostationary nonlinear noise model, in: 2010 IEEE MTT-S International Microwave Symposium Digest, s.l, IEEE-MTT, 2010, pp. 284 - 287 (atti di: 2010 IEEE MTT-S International Microwave Symposium, Anaheim, CA - USA, 23-28 Maggio 2010) [Contributo in Atti di convegno]

C. Florian; P.A. Traverso; F. Filicori, "Non-Linear FET Noise Modelling and Applications", in: European Microwave Week 2009 Workshop Book, s.l, s.n, 2009, pp. 1 - 20 (atti di: European Microwave Week 2009 - EuMW 2009, Roma, 28 Settembre - 2 Ottobre 2009) [Contributo in Atti di convegno]

C. Florian; P.A. Traverso, A set-up with load- and source-pull capabilities for phase noise and frequency stability characterization of microwave devices under oscillating operation, in: IEEE MT-T INTERNATIONAL, IEEE MTT-S International Microwave Symposium Digest, 2009. MTT '09., s.l, s.n, 2009, pp. 1205 - 1208 (atti di: IEEE MTT-S International Microwave Symposium - IMS2009, Boston, MA - USA, 7-12 Giugno 2009) [Contributo in Atti di convegno]

A. Raffo; V. Di Giacomo; P. A. Traverso; A. Santarelli; Giorgio Vannini, An Automated Measurement System Aimed to the Nonlinear Dynamic Characterization of Electron Device Time Dispersion, «IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT», 2009, 58, pp. 2663 - 2670 [articolo]

C. Florian; P.A. Traverso, Investigation of Phase Noise Generation in Microwave Electron Devices Operating in Nonlinear Regime Exploiting a Flexible Load– and Source–Pull Oscillating Setup, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2009, 57, pp. 3491 - 3504 [articolo]

P.A. Traverso; C. Florian; F. Filicori, Noise Measurements for Microwave Electron Device Characterization and Modelling Under Non-Linear Operating Conditions, in: European Microwave Week 2009 Workshop Book - Workshop on Advanced Non-Linear Characterization of RF and Microwave Components, ROME, European Microwave Association, 2009, pp. 1 - 10 (atti di: European Microwave Week 2009 – 4th European Microwave Integrated Circuits Conf. (EuMIC’09), Rome, Italy, Sep. 2009) [Contributo in Atti di convegno]

V. Di Giacomo; A. Santarelli; A. Raffo; P. Traverso; D. Schreurs; J. Lonac; D. Resca; G. Vannini; F. Filicori; M. Pagani, Accurate Nonlinear Electron Device Modelling for Cold FET Mixer Design, in: Proc. of the 3rd European Microwave Integrated Circuits Conference (EuMIC08), LONDON, Horizon House, 2008, pp. 294 - 297 (atti di: European Microwave Week (EuMW08), Amsterdam (The Netherlands), 27-31 Oct 2008) [Contributo in Atti di convegno]

C. Florian; P. A. Traverso, Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of "16th IMEKO TC4 International Symposium - Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements", FLORENCE, s.n, 2008, pp. 185 - 190 (atti di: 16th IMEKO TC4 International Symposium - Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements, Florence, Italy, September 22-24, 2008) [Contributo in Atti di convegno]

A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori, An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of the 16th IMEKO TC4 Symposium, FIRENZE, s.n, 2008, pp. 72 - 77 (atti di: 16th IMEKO TC4 Symposium, Firenze, September 22-24, 2008) [Contributo in Atti di convegno]

V. Di Giacomo; S. Di Falco; A. Raffo; P. A. Traverso; A. Santarelli; G. Vannini; F.Filicori, Breakdown Walkout Investigation in Electron Devices Under Nonlinear Dynamic Regime, in: Proc. of the Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC 2008), s.l, IEEE, 2008, pp. 9 - 12 (atti di: Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC 2008), Malaga (Spain), 24th - 25th Nov. 2008) [Contributo in Atti di convegno]

A. Santarelli; D. Resca; A. Raffo; V. Di Giacomo; P. A. Traverso; G. Vannini; F. Filicori, Optimal Function Approximation For Empirical Look-Up-Table Device Models, «INTERNATIONAL JOURNAL OF MICROWAVE AND OPTICAL TECHNOLOGY», 2008, 3, pp. 165 - 174 [articolo]

P.A. Traverso; G. Pasini; A. Raffo; D. Mirri, The DTCM characterization approach for the qualification of dynamic non-linearities within A/D channels, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of the 16th IMEKO TC4 Symposium: 13th IMEKO TC4 Workshop on ADC Modelling and Testing, FIRENZE, s.n, 2008, pp. 1139 - 1144 (atti di: 16th IMEKO TC4 Symposium: 13th IMEKO TC4 Workshop on ADC Modelling and Testing, Firenze, September 22-24, 2008) [Contributo in Atti di convegno]

Florian C.; Traverso P.A., A Highly Flexible Measurement Set-Up for the LF Noise Up-Conversion and Phase-Noise Performance Characterization of Microwave Electron Devices, in: Proceedings of Instrumentation and Measurement Technology Conference, VARSAVIA, IEEE Instrumentation and Measurement Society, 2007, pp. 1 - 6 (atti di: Instrumentation and Measurement Technology Conference (IMTC 2007), Varsavia (Polonia), 1-3 May 2007) [Contributo in Atti di convegno]

Florian C.; Traverso P. A.; Vannini G.; Filicori F.;, Design of Low Phase Noise Dielectric Resonator Oscillators with GaInP HBT devices exploiting a Non-Linear Noise Model, in: 2007 IEEE/MTT-S International Microwave Symposium, Piscataway, IEEE / Institute of Electrical and Electronics Engineers, «IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST», 2007, 2007, pp. 1525 - 1528 (atti di: IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM 2007, Honolulu, Hawaii, USA, 3-8 Giugno 2007) [Contributo in Atti di convegno]

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