C. Florian; P. A. Traverso; M. Borgarino; F. Filicori, A Non-Linear Noise Model of Bipolar Transistors for the Phase-Noise
Performance Analysis of Microwave Oscillators, in: Symposium Digest, s.l, s.n, 2006, pp. 659 - 662 (atti di: 2006 IEEE MTT-S - International Microwave Symposium -, San Francisco, California (USA), 11/06/06) [Contribution to conference proceedings]
A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori, A Nonquasi-Static Empirical Model of Electron Devices, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2006, 54, N.12, 2006, pp. 4021 - 4031 [Scientific article]
A.Raffo; A.Santarelli; P. A. Traverso; G. Vannini; F. Filicori, A Small-Signal Parameter Based Metric for Nonlinear Models of Electron Device, in: 2006 IEEE MTT-S International Microwave Symposium Digest, 2006, cd-rom, pp. 1101 - 1104 (atti di: International Microwave Symposium, 2006, San Francisco (CA), US, jun 11-16, 2006) [Contribution to conference proceedings]
V. Di Giacomo; A. Santarelli; A. Raffo; P. A. Traverso; G. Vannini; F.Filicori, Accurate Small- and Large-Signal Predictions Using a Simple, Nonquasi-Static, Empirical Model, in: TARGET DAYS 2006 - Book of Prooceedings, WIEN, FTW, 2006, pp. 63 - 66 (atti di: TARGET DAYS 2006, Frascati (Italy), 16-18 Oct, 2006) [Contribution to conference proceedings]
P. A. Traverso; C. Florian; M. Borgarino; F. Filicori, An Empirical Bipolar Device Nonlinear Noise Modeling Approach for Large-Signal Microwave Circuit Analysis, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2006, 54, pp. 4341 - 4352 [Scientific article]
P. A. Traverso; A. Raffo; M. Pirazzini; A. Santarelli; F. Filicori, Automated Microwave-Device Characterization Setup Based on a Technology-Independent Generalized Bias System, «IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT», 2006, 55, pp. 1390 - 1396 [Scientific article]
M. Borgarino; N. Corciulo; C. Florian; P. A. Traverso; F. Fantini; F. Filicori, Bias Dependent, Compact Low-Frequency Noise Model of GaInP/GaAs HBT: Experimental Identification and CAD Implementation, in: Proceedings of IEEE German Microwave Conference - GeMiC 2006, KARLSRUHE, IEEE, 2006(atti di: IEEE German Microwave Conference - GeMiC 2006, KARLSRUHE, Germany, Mar. 2006) [Contribution to conference proceedings]
M. Borgarino; C. Florian; P. A. Traverso; F. Filicori, Microwave Large-Signal Effects on the Low-Frequency Noise Characteristics of GaInP/GaAs HBTs, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2006, 53, pp. 2603 - 2609 [Scientific article]
C. Florian; P. A. Traverso; M. Borgarino; G. Vannini; F. Filicori, Non-Linear Measurement-Based Noise Models of Electron Devices for Low Phase-Noise Oscillator Design, in: Workshop proceedings: Non-linear Device Models and Low Phase Noise Oscillator Design - WS3, Boston, HORIZON HOUSE, 2006, pp. 1 - 51 [Chapter or essay]
Filicori F.; Santarelli A.; Traverso P.A.; Raffo A.; Vannini G.; Pagani M., Nonlinear RF device modelling in the presence of low-frequency dispersive phenomena, «INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING», 2006, 16, pp. 81 - 94 [Scientific article]
A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori; V. A. Monaco, A simple non-quasi-static non-linear model of electron devices, in: Proceedings of European Microwave Week, GAAS’05, PARIS, GAAS Association, 2005, pp. 305 - 308 (atti di: European Microwave Week, GAAS’05, Paris (France), Oct. 2005) [Contribution to conference proceedings]
Raffo A.; Santarelli A.; Traverso P. A.; Pagani M.; Vannini G.; Filicori F., Accurate modeling of electron device I/V characteristics through a simplified large-signal measurement setup, «INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING», 2005, 15, pp. 441 - 452 [Scientific article]
Raffo A.; Santarelli A.;Traverso P. A.; Vannini G.; Palomba F.; Scappaviva F.; Pagani M.; Filicori F., Accurate PHEMT Intermodulation Prediction in the Presence of Low-Frequency Dispersion Effects, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2005, 53, pp. 3449 - 3459 [Scientific article]
P. A. Traverso; A. Raffo; M. Pirazzini; A. Santarelli; F. Filicori, Automated Microwave Device Characterization Set-Up Based on a Technology-Independent Generalized Bias System, in: Proceedings IEEE Instrumentation and Measurement Technology Conference (IMTC’05), OTTAWA, IEEE Instrumentation and Measurement Society, 2005, pp. 457 - 462 (atti di: IEEE Instrumentation and Measurement Technology Conference (IMTC’05), Ottawa (Canada), May 2005) [Contribution to conference proceedings]
P. A. Traverso; G. Pasini; A. Raffo; D. Mirri; G. Iuculano; F. Filicori, Characterization and compensation of dynamic non-linearities in digital data acquisition channels by means of the Discrete-Time Convolution Model, in: Proceedings of XIV IMEKO TC-4 International Symposium, GDYNIA, International Measurement Confederation (IMEKO), 2005, pp. 387 - 392 (atti di: XIV IMEKO TC-4 International Symposium, Gdynia-Jurata (Poland), Sep. 2005) [Contribution to conference proceedings]
