F. Filicori; P. A. Traverso; C. Florian; M. Borgarino, Identification Procedures for the Charge-Controlled Non-Linear Noise Model of Microwave Electron Devices, in: , 2004, 5470, pp. 337 - 348 (atti di: Second SPIE International Symposium on Fluctuations and Noise – Noise in Devices and Circuits II, Maspalomas (Spain), May 2004) [Contribution to conference proceedings]
A. Raffo; A. Santarelli; M. Pagani; P. A. Traverso; G. Vannini, Modelling of PHEMT Low-Frequency I/V Characteristics Through a New Large-Signal Measurement Setup, in: Proceedings of INMMIC 2004, Integrated Non-linear Microwave and Millimetrewave Circuits Workshop, ROME, TEXMAT, 2004, pp. 23 - 26 (atti di: INMMIC 2004, Integrated Non-linear Microwave and Millimetrewave
Circuits Workshop, Rome (Italy), Nov. 2004) [Contribution to conference proceedings]
A. Alabadelah; T. Fernandez; A. Mediavilla; B. Nauwelaers; A. Santarelli; D. Schreurs; A. Tazón; P. A. Traverso, Nonlinear models of microwave power devices and circuits, in: Proceedings of European Microwave Week, GAAS04, AMSTERDAM, GAAS Association, 2004, pp. 191 - 194 (atti di: European Microwave Week, Gallium Arsenide and other Compound Semiconductors Application Symposium, Amsterdam (The Netherlands), Oct. 2004) [Contribution to conference proceedings]
A. Raffo; A. Santarelli; P. A. Traverso; G. Vannini; F. Filicori, On-Wafer I/V Measurement Setup for the Characterization of Low-Frequency Dispersion in Electron Devices, in: Proceedings of IEEE 2004 MTT-S ARFTG 63rd Conference, NEW YORK, IEEE Microwave Theory and Techniques Society, 2004, pp. 21 - 28 (atti di: IEEE 2004 MTT-S ARFTG 63rd Conference, Fort Worth (TX, USA), Jun. 2004) [Contribution to conference proceedings]
D. Mirri; G. Iuculano; P. A. Traverso; G. Pasini, Performance evaluation of cascaded rectangular windows in spectral analysis, «MEASUREMENT», 2004, 36, pp. 37 - 52 [Scientific article]
Costantini A.; Paolo R.P.; Traverso P.A.; Argento D.; Favre G.; Pagani M.; Santarelli A.; Vannini G.; Filicori F., Accurate prediction of PHEMT intermodulation distortion using the nonlinear discrete convolution model, in: IEEE MTT-S International Microwave Symposium Digest (Cat. No.02CH37278), 345 E 47TH ST, NEW YORK, NY 10017 USA, IEEE, 2002, 2, pp. 857 - 860 (atti di: IEEE MTT-S International Microwave Symposium, Seattle, WA, USA, 2-7 June 2002) [Contribution to conference proceedings]
