Foto del docente

Pier Andrea Traverso

Associate Professor

Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"

Academic discipline: ING-INF/07 Electrical and Electronic Measurement

Publications

C. Florian; P. A. Traverso, Active bias network-based measurement set-up for the direct characterization of low-frequency noise currents in electron devices, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of "16th IMEKO TC4 International Symposium - Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements", FLORENCE, s.n, 2008, pp. 185 - 190 (atti di: 16th IMEKO TC4 International Symposium - Exploring New Frontiers of Instrumentation and Methods for Electrical and Electronic Measurements, Florence, Italy, September 22-24, 2008) [Contribution to conference proceedings]

A. Raffo; V. Vadalà; P. A. Traverso; A. Santarelli; G. Vannini; F. Filicori, An Innovative Two-Source Large-Signal Measurement System for the Characterization of Low-Frequency Dispersive Effects in FETs, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of the 16th IMEKO TC4 Symposium, FIRENZE, s.n, 2008, pp. 72 - 77 (atti di: 16th IMEKO TC4 Symposium, Firenze, September 22-24, 2008) [Contribution to conference proceedings]

V. Di Giacomo; S. Di Falco; A. Raffo; P. A. Traverso; A. Santarelli; G. Vannini; F.Filicori, Breakdown Walkout Investigation in Electron Devices Under Nonlinear Dynamic Regime, in: Proc. of the Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC 2008), s.l, IEEE, 2008, pp. 9 - 12 (atti di: Integrated Nonlinear Microwave and Millimetre-wave Circuits (INMMiC 2008), Malaga (Spain), 24th - 25th Nov. 2008) [Contribution to conference proceedings]

A. Santarelli; D. Resca; A. Raffo; V. Di Giacomo; P. A. Traverso; G. Vannini; F. Filicori, Optimal Function Approximation For Empirical Look-Up-Table Device Models, «INTERNATIONAL JOURNAL OF MICROWAVE AND OPTICAL TECHNOLOGY», 2008, 3, pp. 165 - 174 [Scientific article]

P.A. Traverso; G. Pasini; A. Raffo; D. Mirri, The DTCM characterization approach for the qualification of dynamic non-linearities within A/D channels, in: IMEKO - INTERNATIONAL MEASUREMENT CONFEDERATION, Proceedings of the 16th IMEKO TC4 Symposium: 13th IMEKO TC4 Workshop on ADC Modelling and Testing, FIRENZE, s.n, 2008, pp. 1139 - 1144 (atti di: 16th IMEKO TC4 Symposium: 13th IMEKO TC4 Workshop on ADC Modelling and Testing, Firenze, September 22-24, 2008) [Contribution to conference proceedings]

Florian C.; Traverso P.A., A Highly Flexible Measurement Set-Up for the LF Noise Up-Conversion and Phase-Noise Performance Characterization of Microwave Electron Devices, in: Proceedings of Instrumentation and Measurement Technology Conference, VARSAVIA, IEEE Instrumentation and Measurement Society, 2007, pp. 1 - 6 (atti di: Instrumentation and Measurement Technology Conference (IMTC 2007), Varsavia (Polonia), 1-3 May 2007) [Contribution to conference proceedings]

Florian C.; Traverso P. A.; Vannini G.; Filicori F.;, Design of Low Phase Noise Dielectric Resonator Oscillators with GaInP HBT devices exploiting a Non-Linear Noise Model, in: 2007 IEEE/MTT-S International Microwave Symposium, Piscataway, IEEE / Institute of Electrical and Electronics Engineers, 2007, 2007, pp. 1525 - 1528 (atti di: IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM 2007, Honolulu, Hawaii, USA, 3-8 Giugno 2007) [Contribution to conference proceedings]

A. Raffo; A. Santarelli; P. A. Traverso; G. Vannini; F. Filicori, Electron Device Model Parameter Identification Through Large-Signal-Predictive Small-Signal-Based Error Functions, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2007, 55, pp. 1997 - 2005 [Scientific article]

A. Raffo; V. Di Giacomo; P.A. Traverso; A. Santarelli; G. Vannini, Empirical Investigation on Time Dispersion of Microwave Electron Device Characteristics under Nonlinear Dynamic Operating Conditions, in: Proceedings of IEEE Instrumentation and Measurement Technology Conference (IMTC’07), -, IEEE Instrumentation and Measurement Society, 2007, pp. 1 - 6 (atti di: IEEE Instrumentation and Measurement Technology Conference (IMTC’07), Warsaw, Poland, May 1-3, 2007) [Contribution to conference proceedings]

C. Florian; P.A. Traverso; M. Borgarino; F. Filicori, Empirical Nonlinear Noise Models of Field-Effect Devices for Microwave Circuit Large-Signal Noise Analysis, in: Workshop on Noise in Nonlinear Circuits: Theory, Modeling and Measurement Techniques, -, IEEE Microwave Theory and Techniques Society, 2007(atti di: IEEE 2007 MTT-S International Microwave Symposium, Honolulu, USA, June 2007) [Contribution to conference proceedings]

A. Raffo; A. Santarelli; P.A. Traverso; G. Vannini; F.Filicori, Nonlinear characterization and modelling of microwave power FETs affected by low-frequency dispersive effects, in: Workshop Notes of European Microwave Week 2007, WSW6: “Advanced Nonlinear and Power Characterization of Microwave Devices and Systems (TARGET)”, LONDON, Horizon House, 2007, pp. - - - (atti di: Workshop of European Microwave Week 2007, WSW6: “Advanced Nonlinear and Power Characterization of Microwave Devices and Systems (TARGET)”, Munich, Oct 2007) [Contribution to conference proceedings]

P. A. Traverso; G. Pasini; A. Raffo; D. Mirri; G. Iuculano; F. Filicori, On the use of the Discrete-Time Convolution Model for the compensation of non-idealities within digital acquisition channels, «MEASUREMENT», 2007, 40, pp. 527 - 536 [Scientific article]

A. Santarelli; D. Resca; A. Raffo; V. Di Giacomo; P. A. Traverso; G. Vannini; F. Filicori, Optimal function approximation for empirical look-up-table device models (invited), in: Proc. of 11th International Symposium on Microwave and Optical Technology (ISMOT-2007), ROMA, Aracne Editrice srl, 2007, pp. 107 - 110 (atti di: 11th International Symposium on Microwave and Optical Technology (ISMOT-2007), Frascati, Italy, 17-21 Dec 2007) [Contribution to conference proceedings]

C. Florian; P. A. Traverso; M. Borgarino; F. Filicori, A Non-Linear Noise Model of Bipolar Transistors for the Phase-Noise Performance Analysis of Microwave Oscillators, in: Symposium Digest, s.l, s.n, 2006, pp. 659 - 662 (atti di: 2006 IEEE MTT-S - International Microwave Symposium -, San Francisco, California (USA), 11/06/06) [Contribution to conference proceedings]

A. Santarelli; V. Di Giacomo; A. Raffo; P. A. Traverso; G. Vannini; F. Filicori, A Nonquasi-Static Empirical Model of Electron Devices, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2006, 54, N.12, 2006, pp. 4021 - 4031 [Scientific article]

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