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Pier Andrea Traverso

Associate Professor

Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"

Academic discipline: ING-INF/07 Electrical and Electronic Measurement

Publications

Magnone, P.; Traverso, P.A.; Fiegna, C., Experimental technique for the performance evaluation and optimization of 1/f noise spectrum investigation in electron devices, «MEASUREMENT», 2017, 98, pp. 421 - 428 [Scientific article]

Fuochi, F.; Hadi, M.U.; Nanni, J.; Traverso, P.A.; Tartarini, G., Digital Predistortion Technique for the Compensation of Nonlinear Effects in Radio over Fiber Links, in: Proceeding on International Forum on Research and Technologies for Society and Industry Leveraging a better tomorrow (RTSI), 2016, pp. 1 - 6 (atti di: 2nd International Forum on Research and Technologies for Society and Industry (RTSI 2016), Bologna, 7 - 9 Settembre) [Contribution to conference proceedings]

Crescentini, Marco; Traverso, Pier Andrea; Alberti, Paolo; Romani, Aldo; Marchesi, Marco; Cristaudo, Domenico; Canegallo, Roberto; Tartagni, Marco, Experimental characterization of bandwidth limits in hall sensors, in: Proceedings of 21st IMEKO TC­4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing, IMEKO, 2016, pp. 1 - 6 (atti di: 21st IMEKO TC­4 International Symposium on Understanding the World through Electrical and Electronic Measurement, and 19th International Workshop on ADC Modelling and Testing, Budapest, 2016) [Contribution to conference proceedings]

Fuochi, Filippo; Hadi, Muhammad Usman; Nanni, Jacopo; Traverso, Pier Andrea; Tartarini, Giovanni, Reduction of harmonic distortion in radio over fiber links through digital preprocessing, in: XXI RiNEm – Riunione Nazionale di Elettromagnetismo, 2016, pp. 1 - 4 (atti di: XXI RiNEm – Riunione Nazionale di Elettromagnetismo, Parma, 12 - 14 Settembre 2016) [Contribution to conference proceedings]

Traverso, P.A.; Florian, C.; Filicori, F., A fully nonlinear compact modeling approach for high-frequency noise in large-signal operated microwave electron devices, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2015, 63, pp. 352 - 366 [Scientific article]

Santarelli, Alberto; Cignani, Rafael; Niessen, Daniel; Gibiino, Gian Piero; Traverso, Pier Andrea; Schreurs, Dominique; Filicori, Fabio, Multi-bias nonlinear characterization of GaN FET trapping effects through a multiple pulse time domain network analyzer, in: European Microwave Week 2015:, Institute of Electrical and Electronics Engineers Inc., 2015, pp. 81 - 84 (atti di: 10th European Microwave Integrated Circuits Conference, EuMIC 2015, fra, 2015) [Contribution to conference proceedings]

Alberto Santarelli;Rafael Cignani;Gian Piero Gibiino;Daniel Niessen;Pier Andrea Traverso;Corrado Florian;Dominique M. M. -P. Schreurs;Fabio Filicori, A Double-Pulse Technique for the Dynamic I/V Characterization of GaN FETs, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2014, 24, pp. 132 - 134 [Scientific article]

Santarelli, Alberto; Cignani, Rafael; Niessen, Daniel; Gibiino, Gian Piero; Traverso, Pier Andrea; Di Giacomo, Valeria; Chang, Christophe; Floriot, Didier; Schreurs, Dominique; Filicori, Fabio, Evaluation of GaN FET power performance reduction due to nonlinear charge trapping effects, in: European Microwave Week 2014: "Connecting the Future", EuMW 2014 - Conference Proceedings; EuMIC 2014: 9th European Microwave Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 2014, pp. 198 - 201 (atti di: 9th European Microwave Integrated Circuits Conference, EuMIC 2014 - Held as Part of the 17th European Microwave Week, EuMW 2014, Fiera di Roma, ita, 2014) [Contribution to conference proceedings]

Paolo Magnone;Pier Andrea Traverso;Giacomo Barletta;Claudio Fiegna, Experimental characterization of low-frequency noise in power MOSFETs for defectiveness modelling and technology assessment, «MEASUREMENT», 2014, 52, pp. 47 - 54 [Scientific article]

Alberto Santarelli;Daniel Niessen;Rafael Cignani;Gian Piero Gibiino;Pier Andrea Traverso;Corrado Florian;Dominique M. M.-P. Schreurs;Fabio Filicori, GaN FET Nonlinear Modeling Based on Double Pulse I/V Characteristics, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2014, Volume: 62 , Issue: 12 , Part: 2, pp. 3262 - 3273 [Scientific article]

A. Santarelli;D. Niessen;R. Cignani;G. P. Gibiino;P. A. Traverso;C. Florian;D. Schreurs;F. Filicori, Large-signal GaN transistor characterization and modeling including charge trapping nonlinear dynamics, in: Proceedings of 2014 IEEE MTT-S International Microwave Symposium (IMS2014), 2014, pp. 1 - 3 (atti di: 2014 IEEE MTT-S International Microwave Symposium (IMS2014), Tampa (FL) USA, 1-6 June, 2014) [Contribution to conference proceedings]

P. Magnone; P. A. Traverso; C. Fiegna, Optimal Non-parametric Estimation of 1/f Noise Spectrum in Semiconductor Device, in: 19th Symposium IMEKO, 2014, pp. 1046 - 1051 (atti di: 19th Symposium IMEKO, Benevento, September 15 - 17, 2014) [Contribution to conference proceedings]

P. Magnone;G. Barletta;P.A. Traverso;A. Magri;E. Sangiorgi;C. Fiegna, Understanding negative bias temperature stress in p-channel trench-gate power MOSFETs by low-frequency noise measurement2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), in: 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's (ISPSD), Institute of Electrical and Electronics Engineers Inc., 2014, pp. 163 - 166 (atti di: International Symposium on Power Semiconductor Devices and ICs, Waikoloa, HI, 15-19 June 2014) [Contribution to conference proceedings]

Corrado Florian;Pier Andrea Traverso;Alberto Santarelli;Fabio Filicori, An Active Bias Network for the Characterization of Low-Frequency Dispersion in High-Power Microwave Electron Devices, «IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT», 2013, 62, pp. 2857 - 2869 [Scientific article]

Paolo Magnone; Pier Andrea Traverso; Giacomo Barletta; Claudio Fiegna, Low-Frequency Noise Measurements in Silicon Power MOSFETs as a Tool to Experimentally Investigate the Defectiveness of the Gate Oxide, in: 19 th Symposium IMEKO TC 4 Symposium and 17th IWADC Workshop Advances in Instrumentation and Sensors Interoperability, 2013, pp. 240 - 245 (atti di: 19 th Symposium IMEKO TC 4 Symposium and 17th IWADC Workshop Advances in Instrumentation and Sensors Interoperability, Barcelona, Spain, July 18-19, 2013) [Contribution to conference proceedings]

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