S. Reggiani; E. Gnani; A. Gnudi; G. Baccarani; M. Denison; S. Pendharkar; R. Wise; S. Seethara-man, Explanation of the rugged LDMOS behavior by means of numerical analysis, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2009, 56, pp. 2811 - 2818 [articolo]
R. Grassi; A. Gnudi; E. Gnani; S. Reggiani; G. Baccarani, Graphene-Based High-Performance Nanoelectronic Devices, in: Extended Abstracts of WOCSDICE 2009, MALAGA, s.n, 2009, pp. 2 - 9 (atti di: 33rd Workshop on Compound Semiconductor Devices and Integrated Circuits, Malaga, Spain, 17-20 maggio, 2009) [Contributo in Atti di convegno]
S. Reggiani; E. Gnani; A. Gnudi; G. Baccarani; M. Denison; S. Pendharkar; R. Wise; S. Seetharaman, Investigation on saturation effects in the rugged LDMOS transistor, in: Proc. of the 21st ISPSD 2009, BARCELONA, s.n, 2009, pp. 208 - 211 (atti di: 21st International Symposium on Power Semiconductor Devices and ICs (ISPSD 2009), Barcelona, Spain, 14-17 giugno, 2009) [Contributo in Atti di convegno]
R. Grassi; A. Gnudi; E. Gnani; S. Reggiani; G. Baccarani, Mode Space Approach for Tight-Binding Transport Simulation in Graphene Nanoribbon FETs, in: Proc. 13th International Workshop on Computational Electronics, BEIJING, s.n, 2009, pp. 1 - 4 (atti di: 13th International Workshop on Computational Electronics (IWCE 2009), Beijing, China, 27-29 maggio, 2009) [Contributo in Atti di convegno]
E. Gnani; S. Reggiani; A. Gnudi; G. Baccarani; J. Fu; N. Sing; G.Q. Lo; D. L. Kwong, Modeling of Nonvolatile Gate-All-Around Charge Trapping SONOS Memory Cells, in: Proceedings of the 39th European Solid-State Device Research Conference, ATHENS, s.n, 2009, pp. 280 - 283 (atti di: European Solid-State Device Research Conference (ESSDERC 2009), Athens, 14-18 September, 2009) [Contributo in Atti di convegno]
E. Gnani; A. Gnudi; S. Reggiani; G. Baccarani; J. Fu; N. Singh; G.Q. Lo; D.L. Kwong, Performance Analysis of Nonvolatile Gate-All-Around Charge-Trapping TAHOS Memory Cells, in: 2009 International Semiconductor Device Research Symposium Proceedings, COLLEGE PARK, Ken Jones, Zeynep Dilli, 2009, pp. 1 - 2 (atti di: 2009 International Semiconductor Device Research Symposium (ISDRS 2009), College Park, MD, USA, December 9-11, 2009) [Contributo in Atti di convegno]
R. Grassi; A. Gnudi; S. Reggiani; E. Gnani; G. Baccarani, Simulation Study of Graphene Nanoribbon Tunneling
Transistors Including Edge Roughness Effects, in: Proceedings of the ULIS 2009, AACHEN, s.n, 2009, pp. 57 - 60 (atti di: Ultimate Integration on Silicon Conference (ULIS 2009), Aachen, Germany, 18-21 marzo, 2009) [Contributo in Atti di convegno]
S. Reggiani; M. Denison; E. Gnani; A. Gnudi; G. Baccarani; S. Pendharkar; R. Wise, Theoretical Analysis of the Vertical LOCOS DMOS Transistor with Process-Induced Stress Enhancement, in: Proceedings of the 39th European Solid-State Device Research Conference, ATHENS, s.n, 2009, pp. 161 - 164 (atti di: European Solid-State Device Research Conference (ESSDERC 2009), Athens, 14-18 September, 2009) [Contributo in Atti di convegno]
R. Grassi; S. Poli; E Gnani; A. Gnudi; S. Reggiani; G. Baccarani, Tight-binding and effective mass modeling of armchair carbon nanoribbon FETs, «SOLID-STATE ELECTRONICS», 2009, 53, pp. 462 - 467 [articolo]
E. Gnani; A. Gnudi; S. Reggiani; M. Luisier; G. Baccarani, Band Effects on the transport characteristics of ultra-scaled SNW-FETs, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2008, 7, pp. 700 - 709 [articolo]
R. Grassi; A. Gnudi; E. Gnani; S. Reggiani; G. Baccarani, Carbon-based Nanoelectronic Devices for High-Performance Logic Applications, in: The 17th European Workshop on Heterostructure Technology Book of Abstracts, VENICE, CLEUP, 2008, pp. 3 - 7 (atti di: 17th European Workshop on Heterostructure Technology (HETECH 2008), Venice, 3-5 November 2008) [Contributo in Atti di convegno]
S. Poli; S. Reggiani; A. Gnudi; E. Gnani; G. Baccarani, Computational study of the ultimate scaling limits of CNT tunneling devices, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2008, 55, pp. 313 - 321 [articolo]
L. Silvestri; S. Reggiani; E. Gnani; A. Gnudi; M. Rudan; G.Baccarani, Effects of channel orientation, high-k gate stacks and stress on UTB-FETs: a QDD simulation study, in: Proceedings of the IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems, BOSTON, MA, IEEE Press, 2008, pp. 7 - 10 (atti di: IEEE International Workshop on Design and Test of Nano Devices, Circuits and Systems (NDCS 2008), Boston, MA, 29-30 September 2008) [Contributo in Atti di convegno]
R. Grassi; A. Gnudi; E. Gnani; S. Reggiani; G. Baccarani, Graphene Nanoribbon FETs for High-Performance Logic Applications: Perspectives and Challenges, in: 2008 9th International Conference on Solid-State and Integrated-Circuit Technology Proceedings, BEIJING, IEEE Press, 2008, I, pp. 365 - 369 (atti di: 9th International Conference on Solid-State and Integrated-Circuit Technology (ICSICT 2008), Beijing, 21-23 October, 2008) [Contributo in Atti di convegno]
R. Grassi; A. Gnudi; E. Gnani; S. Reggiani; G. Cinacchi; G. Baccarani, Hierarchical modeling of carbon nanoribbon devices for CNR-FETs engineering, in: Conference Digest of the 66th IEEE Device Research Conference, SANTA BARBARA, CA, IEEE Press, 2008, pp. 105 - 106 (atti di: 66th IEEE Device Research Conference (DRC-2008), Santa Barbara, CA, 23-25 June 2008) [Contributo in Atti di convegno]
