R. Brunetti; F. Affinito; C. Jacoboni; E. Piccinini; M. Rudan, Shot noise in single open ion channels: a computational approach based on atomistic simulations, in: Book of Abstracts of the 11th International Workshop on Computational Electronics (IWCE-11), VIENNA, Vienna University of Technology, 2006, pp. 171 - 172 (atti di: IWCE-11, Vienna (Austria), 25-27 maggio 2006) [Contributo in Atti di convegno]
M. Pastore; M. Rudan, Sistemi di gestione integrati, BOLOGNA, Pitagora, 2006, pp. 107 . [libro]
M. Rudan; A. Marchi; R. Brunetti; S. Reggiani; E. Gnani, The R-Sigma Approach to Tunneling in Nanoscale Devices, in: Nonequilibrium carrier dynamics in semiconductors: Proceedings of the 14th International Conference, NEW YORK, Springer, 2006, pp. 137 - 141 (atti di: HCIS-14, Chicago, USA, 25-29 luglio 2005) [Contributo in Atti di convegno]
Rudan M.; Reggiani S.; Gnani E.; Baccarani G.; Corvasce C.; Barlini D.; Ciappa M.; Fichtner W.; Denison M.; Jensen N.; Groos G.; Stecher M., Theory and experimental validation of a new analytical model for the position-dependent Hall Voltage in devices with arbitrary aspect ratio, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2006, 53, pp. 314 - 322 [articolo]
Rudan, Massimo; Gnani, Elena; Reggiani, Susanna; Baccarani, Giorgio, A Coherent Extension of the Transport Equations in Semiconductors Incorporating the Quantum Correction: Part I – Single Particle Dynamics, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2005, 4, pp. 495 - 502 [articolo]
Rudan, Massimo; Gnani, Elena; Reggiani, Susanna; Baccarani, Giorgio, A Coherent Extension of the Transport Equations in Semiconductors Incorporating the Quantum Correction: Part II – Collective Transport, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2005, 4, pp. 503 - 509 [articolo]
S. Reggiani; E. Gnani; M. Rudan; G. Baccarani; S. Bychikhin; J. Kuzmik; D. Pogany; E. Gornik; M. Denison; N. Jensen; G. Groos; M. Stecher, A new numerical and experimental analysis tool for ESD devices by means of the transient interferometric technique, «IEEE ELECTRON DEVICE LETTERS», 2005, 26, pp. 916 - 918 [articolo]
E. Gnani; S. Reggiani; M. Rudan; G. Baccarani, A quantum mechanical analysis of the electrostatics in multiple-gate FETs, in: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2005), TOKYO, IEEE EDS Japan Chapter, 2005, pp. 291 - 294 (atti di: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2005), Tokyo, Japan, 1-3 Settembre 2005) [Contributo in Atti di convegno]
A. Marchi; S. Reggiani; M. Rudan, A Schroedinger-Poisson Solution of CNT-FET Arrays, in: M. HANE, N. SANO, International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2005), TOKYO, IEEE EDS Japan Chapter, 2005, pp. 83 - 86 (atti di: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2005), Tokyo, Japan, 1-3 Settembre 2005) [Contributo in Atti di convegno]
F. AFFINITO; A. BIGIANI; R. BRUNETTI; P. CARLONI; C. JACOBONI; E. PICCININI; M. RUDAN, A Simulative Model for the Analysis of Conduction Properties of Ion Channels Based on First-Principle Approaches, «JOURNAL OF COMPUTATIONAL ELECTRONICS», 2005, 4, pp. 171 - 174 [articolo]
A. Marchi; A. Bertoni; S. Reggiani; M. Rudan, Coherent electron transport in bent cylindrical surfaces, «PHYSICAL REVIEW. B, CONDENSED MATTER AND MATERIALS PHYSICS», 2005, 72, pp. 35403-1 - 35403-10 [articolo]
A. Marchi; A. Bertoni; S. Reggiani; M. Rudan, Coherent surface transport in cylindrical nanosystems, in: Book of Abstracts of the QT2005, BOLOGNA, s.n, 2005, 1, pp. 27 - 27 (atti di: International Conference on Quantum Transport 2005 (QT2005), Bologna, 3-5 July 2005) [atti di convegno-abstract]
R. Katilius; S. Reggiani; M. Rudan, Current Fluctuations in Degenerate Non-Equilibrium Systems, in: Proceedings of the 18th International Conference on Noise and Fluctuations (ICNF 2005), MELVILLE, NY, American Institute of Physics, 2005, pp. 29 - 32 (atti di: 18th International Conference on Noise and Fluctuations (ICNF 2005), Salamanca, Spain, 19-23 September, 2005) [Contributo in Atti di convegno]
M. Rudan; S. Reggiani; E. Gnani; G. Baccarani; C. Corvasce; D. Barlini; M. Ciappa; W. Fichtner; M. Denison; N. Jensen; G. Groos; M. Stecher, Experimental validation of a new analytical model for the position-dependent Hall voltage in semiconductor devices, in: M. BRILLOUET, S. CRISTOLOVEANU, G. GHIBAUDO, T. SKOTNICKI, Proceedings of ESSDERC 2005, GRENOBLE, s.n, 2005(atti di: European Solid-State Device Research Conference, Grenoble, 13-15 Settembre 2005) [Contributo in Atti di convegno]
A. Marchi; E. Gnani; S. Reggiani; M. Rudan; G. Baccarani, Investigating the performance limits of silicon nanowires and carbon nanotube FETs, in: ULIS 2005, BOLOGNA, s.n, 2005(atti di: 6th International Conference on Ultimate Integration of Silicon (ULIS 2005), Bologna, 7-9 Aprile 2005) [Contributo in Atti di convegno]