Foto del docente

Daniela Cavalcoli

Professoressa associata

Dipartimento di Fisica e Astronomia "Augusto Righi"

Settore scientifico disciplinare: FIS/03 FISICA DELLA MATERIA

Pubblicazioni

De Bastiani M.; Armaroli G.; Jalmood R.; Ferlauto L.; Li X.; Tao R.; Harrison G.T.; Eswaran M.K.; Azmi R.; Babics M.; Subbiah A.S.; Aydin E.; Allen T.G.; Combe C.; Cramer T.; Baran D.; Schwingenschlogl U.; Lubineau G.; Cavalcoli D.; De Wolf S., Mechanical Reliability of Fullerene/Tin Oxide Interfaces in Monolithic Perovskite/Silicon Tandem Cells, «ACS ENERGY LETTERS», 2022, 7, pp. 827 - 833 [articolo]

Vecchi, Pierpaolo; Armaroli, Giovanni; Di Sabatino, Marisa; Cavalcoli, Daniela, Iron related precipitates in multicrystalline silicon by conductive atomic force microscopy, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2021, 129, pp. 105789 - 105795 [articolo]

Armaroli G.; Ferlauto L.; Ledee F.; Lini M.; Ciavatti A.; Kovtun A.; Borgatti F.; Calabrese G.; Milita S.; Fraboni B.; Cavalcoli D., X-Ray-Induced Modification of the Photophysical Properties of MAPbBr3Single Crystals, «ACS APPLIED MATERIALS & INTERFACES», 2021, 13, pp. 58301 - 58308 [articolo]Open Access

Demchyshyn S.; Verdi M.; Basirico Laura; Ciavatti A.; Hailegnaw B.; Cavalcoli D.; Scharber M.C.; Sariciftci N.S.; Kaltenbrunner M.; Fraboni B., Designing Ultraflexible Perovskite X-Ray Detectors through Interface Engineering, «ADVANCED SCIENCE», 2020, 7, Article number: 2002586, pp. 1 - 11 [articolo]Open Access

Cavalcoli D.; Minj A.; Fazio M.A.; Cros A.; Heuken M., Strain relaxation, extended defects and doping effects in InxGa1-xN/GaN heterostructures investigated by surface photovoltage, «APPLIED SURFACE SCIENCE», 2020, 515, Article number: 146016, pp. 1 - 9 [articolo]Open Access

D Cavalcoli; M.A. Fazio; A Minj, Defective State Studies in III-Nitride Alloys by Surface Photovoltage Spectroscopy, in: International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII), 2019, pp. 1 - 2 (atti di: International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII), Berlino, Germania, 8-12 settembre, 2019) [Contributo in Atti di convegno]

Cavalcoli, Daniela*; Fazio, Maria Antonietta, Electronic transitions in low dimensional semiconductor structures measured by surface photovoltage spectroscopy, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2019, 92, pp. 28 - 38 [articolo]

Jellite, M.; Rehspringer, J.-L.; Fazio, M.A.; Muller, D.; Schmerber, G.; Ferblantier, G.; Colis, S.; Dinia, A.; Sugiyama, M.; Slaoui, A.; Cavalcoli, D.; Fix, T.*, Investigation of LaVO3based compounds as a photovoltaic absorber, «SOLAR ENERGY», 2018, 162, pp. 1 - 7 [articolo]

Steffens, Jonathan; Fazio, Maria Antonietta; Cavalcoli, Daniela*; Terheiden, Barbara, Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications, «SOLAR ENERGY MATERIALS AND SOLAR CELLS», 2018, 187, pp. 104 - 112 [articolo]

Le Donne, A.; Cavalcoli, D.; Mereu, R.A.; Perani, M.; Pagani, L.; Acciarri, M.; Binetti, S., Study of the physical properties of ZnS thin films deposited by RF sputtering, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2017, 71, pp. 7 - 11 [articolo]

Fazio, Maria Antonietta; Perani, Martina; Brinkmann, Nils; Terheiden, Barbara; Cavalcoli, Daniela, Transport properties of Si based nanocrystalline films investigated by c-AFM, «JOURNAL OF ALLOYS AND COMPOUNDS», 2017, 725, pp. 163 - 170 [articolo]

Perani, M.; Brinkmann, N.; Fazio, M.A.; Hammud, A.; Terheiden, B.; Cavalcoli, D., Annealing effects on SiOxNy thin films: Optical and morphological properties, «THIN SOLID FILMS», 2016, 617, pp. 133 - 137 [articolo]

M.A. Fazio; M. Perani; N. Brinkmann; B. Terheiden; D. Cavalcoli, Characterization of electrical nanoscale properties of Si-based thin films for photovoltaic applications, in: StSPM’16 - Science through Scanning Probe Microscopy, 2016, pp. 1 - 1 (atti di: StSPM’16 - Science through Scanning Probe Microscopy, Bologna, Italia, 20-21 ottobre 2016) [atti di convegno-abstract]

M.A. Fazio; M. Perani; N. Brinkmann; B. Terheiden; D. Cavalcoli, Electrical characterization at the nanoscale of Si-based thin films for photovoltaic applications, in: Electrical characterization at the nanoscale of Si-based thin films for photovoltaic applications, 2016, pp. 1 - 1 (atti di: BIAMS 2016 - Beam Injection Assessment of Microstructures in Semiconductors, Versailles, Francia, 5-9 giugno 2016) [atti di convegno-abstract]

Ruolo editoriale nella rivista «Material Science in Semiconductor Processing»