Foto del docente

Daniela Cavalcoli

Professoressa associata

Dipartimento di Fisica e Astronomia

Settore scientifico disciplinare: FIS/03 FISICA DELLA MATERIA

Pubblicazioni

D Cavalcoli; M.A. Fazio; A Minj, Defective State Studies in III-Nitride Alloys by Surface Photovoltage Spectroscopy, in: International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII), 2019, pp. 1 - 2 (atti di: International Conference on Defects-Recognition, Imaging and Physics in Semiconductors (DRIP XVIII), Berlino, Germania, 8-12 settembre, 2019) [Contributo in Atti di convegno]

Cavalcoli, Daniela*; Fazio, Maria Antonietta, Electronic transitions in low dimensional semiconductor structures measured by surface photovoltage spectroscopy, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2019, 92, pp. 28 - 38 [articolo]

Jellite, M.; Rehspringer, J.-L.; Fazio, M.A.; Muller, D.; Schmerber, G.; Ferblantier, G.; Colis, S.; Dinia, A.; Sugiyama, M.; Slaoui, A.; Cavalcoli, D.; Fix, T.*, Investigation of LaVO3based compounds as a photovoltaic absorber, «SOLAR ENERGY», 2018, 162, pp. 1 - 7 [articolo]

Steffens, Jonathan; Fazio, Maria Antonietta; Cavalcoli, Daniela*; Terheiden, Barbara, Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications, «SOLAR ENERGY MATERIALS AND SOLAR CELLS», 2018, 187, pp. 104 - 112 [articolo]

Daniela Cavalcoli, M.A. Fazio, Giovanni Piacentini, Albert Minj, Pierre Ruterana,, Optical and electrical characterization of ternary and quaternary gallium nitride based alloys, in: 19th International Conference on Extended Defects in Semiconductors, 2018, pp. 1 - 2 (atti di: 19th International Conference on Extended Defects in Semiconductors, Thessaloniki-Greece, 24-29 June 2018) [Contributo in Atti di convegno]

Le Donne, A.; Cavalcoli, D.; Mereu, R.A.; Perani, M.; Pagani, L.; Acciarri, M.; Binetti, S., Study of the physical properties of ZnS thin films deposited by RF sputtering, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2017, 71, pp. 7 - 11 [articolo]

Daniela Cavalcoli, Surface Photovoltage studies of surface and defect states in semiconductors, in: Gettering and Defect Engineering In Semiconductor Technology XVII, 2017, pp. 106 - 106 (atti di: Gettering and Defect Engineering In Semiconductor Technology XVII, Lopota resort, Kacheti, Georgia, October 01-06, 2017) [Contributo in Atti di convegno]

Fazio, MARIA ANTONIETTA; Perani, Martina; Brinkmann, Nils; Terheiden, Barbara; Cavalcoli, Daniela, Transport properties of Si based nanocrystalline films investigated by c-AFM, «JOURNAL OF ALLOYS AND COMPOUNDS», 2017, 725, pp. 163 - 170 [articolo]

M. Perani; M. A. Fazio; N. Brinkmann; B. Terheiden; D. Cavalcoli, Annealing effects on silicon oxy-nitride thin films: optical, structural and morphological properties, in: BIAMS 2016 - Beam Injection Assessment of Microstructures in Semiconductors, 2016(atti di: BIAMS 2016 - Beam Injection Assessment of Microstructures in Semiconductors, Versailles, France, 5-9 giugno 2016) [atti di convegno-poster]

Perani, M.; Brinkmann, N.; Fazio, M.A.; Hammud, A.; Terheiden, B.; Cavalcoli, D., Annealing effects on SiOxNy thin films: Optical and morphological properties, «THIN SOLID FILMS», 2016, 617, pp. 133 - 137 [articolo]

M.A. Fazio; M. Perani; N. Brinkmann; B. Terheiden; D. Cavalcoli, Characterization of electrical nanoscale properties of Si-based thin films for photovoltaic applications, in: StSPM’16 - Science through Scanning Probe Microscopy, 2016, pp. 1 - 1 (atti di: StSPM’16 - Science through Scanning Probe Microscopy, Bologna, Italia, 20-21 ottobre 2016) [atti di convegno-abstract]

M.A. Fazio; M. Perani; N. Brinkmann; B. Terheiden; D. Cavalcoli, Electrical characterization at the nanoscale of Si-based thin films for photovoltaic applications, in: Electrical characterization at the nanoscale of Si-based thin films for photovoltaic applications, 2016, pp. 1 - 1 (atti di: BIAMS 2016 - Beam Injection Assessment of Microstructures in Semiconductors, Versailles, Francia, 5-9 giugno 2016) [atti di convegno-abstract]

Ruolo editoriale nella rivista «Material Science in Semiconductor Processing»

Perani, Martina; Carapezzi, Stefania; Mutta, GEETA RANI; Cavalcoli, Daniela, Nanostructured surfaces investigated by quantitative morphological studies, «NANOTECHNOLOGY», 2016, 27, pp. 185703 - 185711 [articolo]

Cavalcoli, Daniela; Cros, Ana; Rigutti, Lorenzo, Preface of the Special Issue: Special Issue: III-Nitride Nanostructures Preface, in: Cavalcoli, Daniela, Special Issue: III-Nitride Nanostructures, Amsterdam, Elsevier, 2016, pp. 1 - 1 [prefazione]