Foto del docente

Daniela Cavalcoli

Professoressa associata

Dipartimento di Fisica e Astronomia

Settore scientifico disciplinare: FIS/03 FISICA DELLA MATERIA

Pubblicazioni

Cavalcoli, Daniela*; Fazio, Maria Antonietta, Electronic transitions in low dimensional semiconductor structures measured by surface photovoltage spectroscopy, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2019, 92, pp. 28 - 38 [articolo]

Jellite, M.; Rehspringer, J.-L.; Fazio, M.A.; Muller, D.; Schmerber, G.; Ferblantier, G.; Colis, S.; Dinia, A.; Sugiyama, M.; Slaoui, A.; Cavalcoli, D.; Fix, T.*, Investigation of LaVO3based compounds as a photovoltaic absorber, «SOLAR ENERGY», 2018, 162, pp. 1 - 7 [articolo]

Steffens, Jonathan; Fazio, Maria Antonietta; Cavalcoli, Daniela*; Terheiden, Barbara, Multi-characterization study of interface passivation quality of amorphous sub-stoichiometric silicon oxide and silicon oxynitride layers for photovoltaic applications, «SOLAR ENERGY MATERIALS AND SOLAR CELLS», 2018, 187, pp. 104 - 112 [articolo]

Le Donne, A.; Cavalcoli, D.; Mereu, R.A.; Perani, M.; Pagani, L.; Acciarri, M.; Binetti, S., Study of the physical properties of ZnS thin films deposited by RF sputtering, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2017, 71, pp. 7 - 11 [articolo]

Fazio, MARIA ANTONIETTA; Perani, Martina; Brinkmann, Nils; Terheiden, Barbara; Cavalcoli, Daniela, Transport properties of Si based nanocrystalline films investigated by c-AFM, «JOURNAL OF ALLOYS AND COMPOUNDS», 2017, 725, pp. 163 - 170 [articolo]

Perani, M.; Brinkmann, N.; Fazio, M.A.; Hammud, A.; Terheiden, B.; Cavalcoli, D., Annealing effects on SiOxNy thin films: Optical and morphological properties, «THIN SOLID FILMS», 2016, 617, pp. 133 - 137 [articolo]

M. Perani; M. A. Fazio; N. Brinkmann; B. Terheiden; D. Cavalcoli, Annealing effects on silicon oxy-nitride thin films: optical, structural and morphological properties, in: BIAMS 2016 - Beam Injection Assessment of Microstructures in Semiconductors, 2016(atti di: BIAMS 2016 - Beam Injection Assessment of Microstructures in Semiconductors, Versailles, France, 5-9 giugno 2016) [atti di convegno-poster]

M.A. Fazio; M. Perani; N. Brinkmann; B. Terheiden; D. Cavalcoli, Characterization of electrical nanoscale properties of Si-based thin films for photovoltaic applications, in: StSPM’16 - Science through Scanning Probe Microscopy, 2016, pp. 1 - 1 (atti di: StSPM’16 - Science through Scanning Probe Microscopy, Bologna, Italia, 20-21 ottobre 2016) [atti di convegno-abstract]

M.A. Fazio; M. Perani; N. Brinkmann; B. Terheiden; D. Cavalcoli, Electrical characterization at the nanoscale of Si-based thin films for photovoltaic applications, in: Electrical characterization at the nanoscale of Si-based thin films for photovoltaic applications, 2016, pp. 1 - 1 (atti di: BIAMS 2016 - Beam Injection Assessment of Microstructures in Semiconductors, Versailles, Francia, 5-9 giugno 2016) [atti di convegno-abstract]

Ruolo editoriale nella rivista «Material Science in Semiconductor Processing»

Perani, Martina; Carapezzi, Stefania; Mutta, GEETA RANI; Cavalcoli, Daniela, Nanostructured surfaces investigated by quantitative morphological studies, «NANOTECHNOLOGY», 2016, 27, pp. 185703 - 185711 [articolo]

Cavalcoli, Daniela; Cros, Ana; Rigutti, Lorenzo, Preface of the Special Issue: Special Issue: III-Nitride Nanostructures Preface, in: Cavalcoli, Daniela, Special Issue: III-Nitride Nanostructures, Amsterdam, Elsevier, 2016, pp. 1 - 1 [prefazione]

Pomaska, Manuel; Mock, Jan; Köhler, Florian; Zastrow, Uwe; Perani, Martina; Astakhov, Oleksandr; Cavalcoli, Daniela; Carius, Reinhard; Finger, Friedhelm; Ding, Kaining, Role of oxygen and nitrogen in n-type microcrystalline silicon carbide grown by hot wire chemical vapor deposition, «JOURNAL OF APPLIED PHYSICS», 2016, 120, pp. 225105 - 225105 [articolo]

Minj, A; Skuridina, D.; Cavalcoli, D.; Cros, A.; Vogt, P.; Kneissl, M.; Giesen, C.; Heuken, M., Surface properties of AlInGaN/GaN heterostructure, «MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING», 2016, 55, pp. 26 - 31 [articolo]

Albert Minj;Daniela Cavalcoli;Geeta Rani Mutta Popuri;Arantxa Vilalta-Clemente;Pierre Ruterana;Anna Cavallini, Electrical properties of extended defects in III-nitrides, «ACTA MATERIALIA», 2015, 89, pp. 290 - 297 [articolo]

Ultimi avvisi

Al momento non sono presenti avvisi.