Ruolo editoriale nella rivista «IEEE Transactions on Computers»
Ruolo editoriale nella rivista «IEEE Transactions on Emerging Topics in Computing»
Ruolo editoriale nella rivista «Journal of Electronic Testing: Theory and Applications (JETTA)»
Grossi, Marco; Omana, Martin; Metra, Cecilia, Impact of aging on temperature measurements performed using a resistive temperature sensor with sensor-to-microcontroller direct interface, «MICROELECTRONICS RELIABILITY», 2025, 169, Article number: 115729, pp. 1 - 11 [articolo]
Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea, Novel Physical Unclonable Function Implementation for Microcontrollers and Field Programmable Gate Arrays, «IEEE ACCESS», 2025, 13, Article number: 10942602, pp. 55970 - 55983 [articolo]Open Access
Omana, M.; Menghi, A.; Stefani, A.; Vicini, E.; Metra, C.; Froio, Giuseppe; Petrucci, Stefano, On-Line Test of Fully Integrated Voltage Regulators for High Performance Microprocessors of Autonomous Systems, in: Proceedings of the 2025 IEEE 31st International Symposium on On-Line Testing and Robust System Design (IOLTS), 2025, pp. 1 - 7 (atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Ischia, Italy, 07-09 July 2025) [Contributo in Atti di convegno]
Grossi, M.; Omana, M.; Metra, C.; Acquaviva, A., Physical Unclonable Functions’ Reliability Modeling for Wireless Sensor Networks, in: 2025 AEIT International Annual Conference (AEIT), 2025, pp. 1 - 6 (atti di: AEIT International Annual Conference (AEIT), Amantea, Italy, 10-12 September 2025) [Contributo in Atti di convegno]
Omana, M.; Venigalla, Y.; Naldi, M.; Metra, C., Risks of Silent Data Corruption Due to the Combined Effects of Latent Faults and Aging Phenomena Affecting FinFET-Based ICs, «IEEE ACCESS», 2025, 13, Article number: 11206135, pp. 181349 - 181362 [articolo]Open Access
Nisiotis, L.; Metra, C.; Athavale, J.; Milojcic, D.; Dukes, S.; Ranaweera, J., The Emerging Metaverse: IEEE ISEMV 2024 Retrospective and Future Directions, «COMPUTER», 2025, 58, pp. 58 - 64 [articolo]
Grossi, Marco; Manoni, Simone; Parisi, Emanuele; Omana, Martin; Metra, Cecilia; Alfonsi, Fabrizio; Gabrielli, Alessandro; Acquaviva, Andrea, A PCI Express Based Data Acquisition System for the Monitoring of Code Traces of RISC-V Microprocessors, in: The 8th International Conference on System Reliability and Safety (ICSRS 2024), 2024, pp. 1 - 6 (atti di: International Conference on System Reliability and Safety, Catania (Sicily), November 20-22, 2024) [Contributo in Atti di convegno]
Grossi, Marco; Omana, Martin; Metra, Cecilia; Acquaviva, Andrea, A Ring Oscillator Based Physical Unclonable Function with Enhanced Challenge Response Pairs to Improve the Security of Internet of Things Devices, «ENGINEERING PROCEEDINGS», 2024, 82, pp. 1 - 9 [articolo]Open Access
Omana, M.; Grossi, M.; Rossi, D.; Metra, C., Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs), «MICROELECTRONICS RELIABILITY», 2024, 162, Article number: 115520, pp. 1 - 10 [articolo]Open Access
Omana, M.; Cantagallo, F.; Finelli, F.; Metra, C., AI for Cyberattacks’ Detection in the Metaverse, in: Proceedings of the IEEE International Symposium on the Emerging Metaverse (ISEMV 2024), 2024, pp. 1 - 4 (atti di: IEEE International Symposium on the Emerging Metaverse (ISEMV 2024), Bellevue, Seattle (WA), 21 Ottobre 2024) [Contributo in Atti di convegno]
Zhupa, M.; Naldi, M.; Omana, M.; Metra, C., On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024, pp. 1 - 3 (atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, 3-5 July 2024) [Contributo in Atti di convegno]
Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli, Reliability of AI in Predicting the State of Health of Li-Ion Batteries, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024, pp. 1 - 7 (atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, 3-5 July 2024) [Contributo in Atti di convegno]
