Ruolo editoriale nella rivista «IEEE Transactions on Computers»
Ruolo editoriale nella rivista «IEEE Transactions on Emerging Topics in Computing»
Ruolo editoriale nella rivista «Journal of Electronic Testing: Theory and Applications (JETTA)»
M. Omana, M. Grossi, D. Rossi, C. Metra, Aging Resilient Ring Oscillators for Reliable Physically Unclonable Functions (PUFs), «MICROELECTRONICS RELIABILITY», 2024, 162, pp. 1 - 10 [articolo]
M. Omana, F. Cantagallo, F. Finelli, C. Metra, AI for Cyberattacks’ Detection in the Metaverse, in: Proceedings of the IEEE International Symposium on the Emerging Metaverse (ISEMV 2024), 2024, pp. 1 - 4 (atti di: IEEE International Symposium on the Emerging Metaverse (ISEMV 2024), Bellevue, Seattle (WA), 21 Ottobre 2024) [Contributo in Atti di convegno]
M. Zhupa, M. Naldi, M. Omana, C. Metra, On the Reliability of Clock Monitoring Units for Safety Critical Applications’ Microcontrollers, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024(atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, 3-5 July 2024) [atti di convegno-poster]
Sara Cretí; Martin Omana; Cecilia Metra; Gianni Borelli, Reliability of AI in Predicting the State of Health of Li-Ion Batteries, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024, pp. 1 - 7 (atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, 3-5 July 2024) [Contributo in Atti di convegno]
M. Omana; A. Manfredi; C. Metra; R. Locatelli; M. Chiavacci; S. Petrucci, Silent Data Corruption and Reliability Risks due to Faults Affecting High Performance Microprocessors’ Caches, in: Proceedings of the 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2024, pp. 1 - 6 (atti di: 2024 IEEE 30th International Symposium on On-Line Testing and Robust System Design (IOLTS), Rennes, France, 3-5 July 2024) [Contributo in Atti di convegno]
William Fornaciari; Federico Reghenzani; Federico Terraneo; Davide Baroffio; Cecilia Metra; Martin Omana; Josie E. Rodriguez Condia; Matteo Sonza Reorda; Robert Birke;Iacopo Colonnelli; Gianluca Mittone; Marco Aldinucci; Gabriele Mencagli; Francesco Iannone; Filippo Palombi; Giuseppe Zummo; Daniele Cesarini;Federico Tesser, RISC-V-based Platforms for HPC: Analyzing Non-functional Properties for Future HPC and Big-Data Clusters, in: Proceedings of the 22nd International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS), Springer, 2023, pp. 395 - 410 (atti di: 23rd International Conference on Embedded Computer Systems: Architectures, Modeling, and Simulation (SAMOS), SAMOS, 2-6 July 2023) [Contributo in Atti di convegno]
Martin Omana, Marco Grossi, Cecilia Metra, Early detection of photovoltaic system inverter faults, «MICROELECTRONICS RELIABILITY», 2022, 135, pp. 1 - 13 [articolo]
F. Finelli; M. Omana; C. Metra, Impact of Soft Errors on High Performance Autoencoders for Cyberattack Detection, in: IEEE Latin-American Test Symposium, 2022, pp. 1 - 6 (atti di: 23rd IEEE Latin-American Test Symposium, Montevideo, Uruguay (evento virtuale), 5-8 Settembre 2022) [Contributo in Atti di convegno]
Marco Grossi; Martin Omana; Daniele Rossi; Biagio Marzulli; Cecilia Metra, Novel BTI Robust Ring-Oscillator-Based Physically Unclonable Function, in: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), 2022, pp. 1 - 7 (atti di: 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS), Torino, Italia, 12-14 Settembre 2022) [Contributo in Atti di convegno]
Omana M.E.; Bardhan S.; Metra C., Reliability Risks Due to Faults Affecting Selectors of ReRAMs and Possible Solutions, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2022, 10, Article number: 9557806, pp. 2086 - 2091 [articolo]Open Access
S. diamond; L. de Floriani; J-L. Gaudiot; H. Kasahara; C. Metra; F. Shull, ComPSaC 2021 president’s panel, in: IEEE 45th Annual Computers, Software, and Applications Conference (COMPSAC), 2021, pp. 1 - 2 (atti di: 2021 IEEE 45th Annual Computers, Software, and Applications Conference (COMPSAC), Madrid, Spagna, 9 Settembre 2021) [atti di convegno-abstract]
C. Metra, Safety and Resiliency Challenges for Highly Autonomous Intelligent Systems, in: IEEE 45th Annual Computers, Software, and Applications Conference (COMPSAC), 2021, pp. 1 - 1 (atti di: 2021 IEEE 45th Annual Computers, Software, and Applications Conference (COMPSAC), Madrid, Spagna, 9 Settembre 2021) [atti di convegno-abstract]
