c. Metra, The 2019 IEEE Computer Society: Targeting Member Satisfaction and Technical Excellence, «COMPUTER», 2019, 52, pp. 4 - 6 [replica/breve intervento]
Martin Omana; Tusharasandeep Edara; Cecilia Metra, Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2018, 6, pp. 488 - 497 [articolo]
Cecilia Metra, Message from the Editor-in-Chief, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2018, 6, pp. 3 - 4 [articolo]
Martin, Omana; Marco, Padovani; Kreshnik, Veliu; Cecilia, Metra; Juergen, Alt; Rajesh, Galivanche, New Approaches for Power Binning of High Performance Microprocessors, «IEEE TRANSACTIONS ON COMPUTERS», 2017, 66, pp. 1159 - 1171 [articolo]
Omaña, Martin; Rossi, Daniele; Fuzzi, Filippo; Metra, Cecilia; Tirumurti, Chandrasekharan Chandra; Galivanche, Rajesh, Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2017, 25, pp. 238 - 246 [articolo]
Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia, Impact of Aging Phenomena on Latches’ Robustness, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2016, 15, pp. 129 - 136 [articolo]
Omana, M.; Fiore, A.; Metra, C., Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems, in: Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016, 2016, pp. 672 - 677 (atti di: Design, Automation and Test in Europe Conference and Exhibition, DATE, Dresden, Germany, 14-18 Marzo 2016) [Contributo in Atti di convegno]
Omaña, M.; Rossi, D.; Beniamino, E.; Metra, C.; Tirumurti, C.; Galivanche, R., Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST, «IEEE TRANSACTIONS ON COMPUTERS», 2016, 65, pp. 2484 - 2494 [articolo]
Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L., Cryptanalysis of Simplified-AES Encrypted Communication, «INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY», 2015, 13, pp. 142 - 150 [articolo]
D. Rossi; M. Omaña; C. Metra; A. Paccagnella, Impact of Bias Temperature Instability on Soft Error Susceptibility, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 743 - 751 [articolo]
Kochte, Michael A.; Dalirsani, Atefe; Bernabei, Andrea; Omana, Martin; Metra, Cecilia; Wunderlich, Hans-Joachim, Intermittent and Transient Fault Diagnosis on Sparse Code Signatures, in: Proceedings of the Asian Test Symposium, IEEE Computer Society, 2015, 2016-, pp. 157 - 162 (atti di: 24th IEEE Asian Test Symposium, ATS 2015, ind, 2015) [Contributo in Atti di convegno]
M. Omaña; D. Rossi; D. Giaffreda; C. Metra; TM Mak; A. Rahman; S. Tam, Low-Cost On-Chip Clock Jitter Measurement Scheme, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 435 - 443 [articolo]
Rossi, Daniele; Omana, Martin; Giaffreda, Daniele; Metra, Cecilia, Modeling and Detection of Hotspot in Shaded Photovoltaic Cells, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 1031 - 1039 [articolo]
Ruolo editoriale nella rivista «ACM Transactions on Design Automation of Electronic Systems»
D. Rossi; M. Omaña; J. M. Cazeaux; C. Metra; TM. Mak, Clock Faults Induced Min and Max Delay Violations, «JOURNAL OF ELECTRONIC TESTING», 2014, 30, pp. 111 - 123 [articolo]
