Maurizio Millesimo is a postdoctoral research fellow at the Advanced Research Center on Electronic Systems (ARCES), where he has worked on the experimental characterization and TCAD simulation of the reliability of GaN-based power semiconductor devices.
He obtained his Master’s degree in Electronic and Telecommunications Engineering from the University of Bologna in March 2020, and his PhD in Electronic Engineering, Telecommunications, and Information Technologies (ET-IT) from the University of Bologna in 2024.
Between 2019 and 2022, he was a visiting student for 12 months at the research center IMEC vzw in Belgium, working on the reliability of Gallium Nitride-based power devices.
In April 2020, he joined the Advanced Research Center on Electronic Systems (ARCES) as a research fellow, working on the experimental characterization and TCAD modeling of GaN-based power semiconductor devices with p-GaN gate technology.
