C. Metra; C. Thibeault, Foreword, in: Proceedings of 29th IEEE VLSI Test Symposium, LOS ALAMITOS, C. Metra, C. Thibeault, 2011, pp. ix - ix [Brief introduction]
C. Metra; R. Galivanche, Guest Editors' Introduction: Special Section on Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems, in: C. METRA R. GALIVANCHE, IEEE TRANSACTIONS ON COMPUTERS, LOS ALAMITOS, C. Metra, R. Galivanche, 2011, pp. 1217 - 1218 [Brief introduction]
D. Rossi; M. Omaña; C. Metra; A. Paccagnella, Impact of Aging Phenomena on Soft Error Susceptibility, in: Proceedings of 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, LOS ALAMITOS, P. Joshi, M. Violante, G. Chapman, F. Salice, 2011, pp. 18 - 24 (atti di: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Vancouver (B.C.), Canada, 3-5 October 2011) [Contribution to conference proceedings]
M. Omaña; C. Metra; T. M. Mak; S. Tam, Low-Cost Dynamic Compensation Scheme for Local Clocks of Next Generation High Performance Microprocessors, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2011, 19, pp. 2322 - 2325 [Scientific article]
D. Giaffreda; M. Omaña; D. Rossi; C. Metra, Model for Thermal Behavior of Shaded Photovoltaic Cells Under Hot-Spot Condition, in: Proceedings of 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, LOS ALAMITOS, P. Joshi, M. Violante, G. Chapman, F. Salice, 2011, pp. 252 - 258 (atti di: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, Vancouver (B.C.), Canada, 3-5 ottobre 2011) [Contribution to conference proceedings]
M. Omaña; D. Rossi; C. Metra, High-Performance Robust Latches, «IEEE TRANSACTIONS ON COMPUTERS», 2010, 59, pp. 1455 - 1465 [Scientific article]
C. Metra, Journal of Electronic Testing, BOSTON/NORWELL, C. Metra, 2010, pp. 1 (Special Issue on the IEEE European Test Symposium 2009). [Editorship]
D. Rossi; M. Omaña; G. Berghella; C. Metra; A. Jas; T. Chandra; R. Galivanche, Low Cost and Low Intrusive Approach to Test On-Line the Scheduler of High Performance Microprocessors, in: Proceedings of 2010 ACM International Conference on Computing Frontiers, NEW YORK, N.M. Amato, H. Franke, P.H.J. Kelly, 2010, pp. 113 - 114 (atti di: 2010 ACM International Conference on Computing Frontiers, Bertinoro, Italy, May 17-19, 2010) [Contribution to conference proceedings]
M. Omaña; D. Rossi; N. Bosio; C. Metra, Novel Low-Cost Aging Sensor, in: Proceedings of 2010 ACM International Conference on Computing Frontiers, NEW YORK, N.M. Amato, H. Franke, P.H.J. Kelly, 2010, pp. 93 - 94 (atti di: 2010 ACM International Conference on Computing Frontiers, Bertinoro, Italy, 17-19 May, 2010) [Contribution to conference proceedings]
M. Omaña; D. Giaffreda; C. Metra; TM Mak; S. Tam; A. Rahman, On-Die Ring Oscillator Based Measurement Scheme for Process Parameter Variations and Clock Jitter, in: Proceedings of The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, LOS ALAMITOS, G. Chapman, F. Salice, H. Ito, S. Tragoudas, 2010, pp. 265 - 272 (atti di: The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Kyoto, Japan, 6-8 October 2010) [Contribution to conference proceedings]
M. Omaña; D. Rossi; N. Bosio; C. Metra, Self-Checking Monitor for NBTI Due Degradation, in: Proceedings of the IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, LOS ALAMITOS, F. Azais, K. Chakrabarty, 2010, pp. 1 - 6 (atti di: IEEE 16th International Mixed-Signals, Sensors and Systems Test Workshop, Montpellier, France, June 7-9, 2010) [Contribution to conference proceedings]
Ruolo editoriale nella rivista «Special Section on Concurrent On-Line Testing and Error/Fault Resilience of Digital Systems»
D. Rossi; M. Omaña; C. Metra, Transient Fault and Soft Error On-Die Monitoring Scheme, in: Proceedings of The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, LOS ALAMITOS, G. Chapman, F. Salice, H. Ito, S. Tragoudas, 2010, pp. 391 - 398 (atti di: The 25th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Kyoto, Japan, 6-8 October 2010) [Contribution to conference proceedings]
D. Rossi; J.M. Cazeaux; M. Omaña; C. Metra; A. Chatterjee, Accurate Linear Model for SET Critical Charge Estimation, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2009, 17, pp. 1161 - 1166 [Scientific article]
M. Omaña; M. Marzencki; R. Specchia; C. Metra; B. Kaminska, Concurrent Detection of Faults Affecting Energy Harvesting Circuits of Self-Powered Wearable Sensors, in: Proceedings of The 24rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, LOS ALAMITOS, D. Gizopoulos, M. Tehranipoor, S. Tragoudas, 2009, pp. 127 - 135 (atti di: The 24rd IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Chicago (Illinois), USA, 7-9 Ottobre 2009) [Contribution to conference proceedings]
