Foto del docente

Cecilia Metra

Full Professor

Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"

Academic discipline: IINF-01/A Electronics

Publications

75. R. Aitken, C. Metra, Special Section on Emerging Trends and Design Paradigms for Memory Systems and Storage, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2019, 7, pp. 433 - 434 [Scientific article]

Metra, c., The 2019 IEEE Computer Society: Hit Target on Member Satisfaction and Technical Excellence, «COMPUTER», 2019, 52, pp. 4 - 11 [Scientific article]

c. Metra, The 2019 IEEE Computer Society: Targeting Member Satisfaction and Technical Excellence, «COMPUTER», 2019, 52, pp. 4 - 6 [Comment or similar]

Martin Omana; Tusharasandeep Edara; Cecilia Metra, Low-Cost Strategy to Mitigate the Impact of Aging on Latches’ Robustness, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2018, 6, pp. 488 - 497 [Scientific article]

Cecilia Metra, Message from the Editor-in-Chief, «IEEE TRANSACTIONS ON EMERGING TOPICS IN COMPUTING», 2018, 6, pp. 3 - 4 [Scientific article]

Martin, Omana; Marco, Padovani; Kreshnik, Veliu; Cecilia, Metra; Juergen, Alt; Rajesh, Galivanche, New Approaches for Power Binning of High Performance Microprocessors, «IEEE TRANSACTIONS ON COMPUTERS», 2017, 66, pp. 1159 - 1171 [Scientific article]

Omaña, Martin; Rossi, Daniele; Fuzzi, Filippo; Metra, Cecilia; Tirumurti, Chandrasekharan Chandra; Galivanche, Rajesh, Scalable Approach for Power Droop Reduction During Scan-Based Logic BIST, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2017, 25, pp. 238 - 246 [Scientific article]

Omana, MARTIN EUGENIO; Rossi, Daniele; Edara, T.; Metra, Cecilia, Impact of Aging Phenomena on Latches’ Robustness, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2016, 15, pp. 129 - 136 [Scientific article]

Omana, M.; Fiore, A.; Metra, C., Inverters' Self-Checking Monitors for Reliable Photovoltaic Systems, in: Proceedings of the 2016 Design, Automation and Test in Europe Conference and Exhibition, DATE 2016, 2016, pp. 672 - 677 (atti di: Design, Automation and Test in Europe Conference and Exhibition, DATE, Dresden, Germany, 14-18 Marzo 2016) [Contribution to conference proceedings]

Omaña, M.; Rossi, D.; Beniamino, E.; Metra, C.; Tirumurti, C.; Galivanche, R., Low-Cost and High-Reduction Approaches for Power Droop during Launch-On-Shift Scan-Based Logic BIST, «IEEE TRANSACTIONS ON COMPUTERS», 2016, 65, pp. 2484 - 2494 [Scientific article]

Vimalathithan, R.; Rossi, D.; Omana, M.; Metra, C.; Valarmathi, M. L., Cryptanalysis of Simplified-AES Encrypted Communication, «INTERNATIONAL JOURNAL OF COMPUTER SCIENCE AND INFORMATION SECURITY», 2015, 13, pp. 142 - 150 [Scientific article]

D. Rossi; M. Omaña; C. Metra; A. Paccagnella, Impact of Bias Temperature Instability on Soft Error Susceptibility, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 743 - 751 [Scientific article]

Kochte, Michael A.; Dalirsani, Atefe; Bernabei, Andrea; Omana, Martin; Metra, Cecilia; Wunderlich, Hans-Joachim, Intermittent and Transient Fault Diagnosis on Sparse Code Signatures, in: Proceedings of the Asian Test Symposium, IEEE Computer Society, 2015, 2016-, pp. 157 - 162 (atti di: 24th IEEE Asian Test Symposium, ATS 2015, ind, 2015) [Contribution to conference proceedings]

M. Omaña; D. Rossi; D. Giaffreda; C. Metra; TM Mak; A. Rahman; S. Tam, Low-Cost On-Chip Clock Jitter Measurement Scheme, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 435 - 443 [Scientific article]

Rossi, Daniele; Omana, Martin; Giaffreda, Daniele; Metra, Cecilia, Modeling and Detection of Hotspot in Shaded Photovoltaic Cells, «IEEE TRANSACTIONS ON VERY LARGE SCALE INTEGRATION (VLSI) SYSTEMS», 2015, 23, pp. 1031 - 1039 [Scientific article]