D. Rossi; M. Omaña; C. Metra; A. Pagni, Checker No-Harm Alarm Robustness, in: Proceedings 12th IEEE International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle, 2006, 1, pp. 275 - 280 (atti di: 12th IEEE International On-Line Testing Symposium, Como, Italy, 10-12 July, 2006) [Contributo in Atti di convegno]
M. Omaña; J.M. Cazeaux; D. Rossi; C. Metra, Low-Cost and Highly Reliable Detector for Transient and Crosstalk Faults Affecting FPGA Interconnects, in: Proceedings Design, Automation and Test in Europe Conference and Exhibition, LOS ALAMITOS, D. Sciuto, G. Gielen, 2006, 1, pp. 170 - 175 (atti di: Design, Automation and Test in Europe Conference and Exhibition (DATE 2006), Messe Munich, Germany, 6-10 March, 2006) [Contributo in Atti di convegno]
C. Metra; M. Omaña; D. Rossi; J.M. Cazeaux; TM Mak, Path (Min) delay Faults and Their Impact on Self-Checking Circuits' Operation, in: Proceedings 12th IEEE International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, M. Nicolaidis, R. Aitken, R. Leveugle, 2006, 1, pp. 17 - 22 (atti di: 12th IEEE International On-Line Testing Symposium, Como, Italy, 10-12 July, 2006) [Contributo in Atti di convegno]
R. Leveugle; R. Aitken; C. Metra; M. Nicolaidis, Proceedings 12th IEEE International On-Line Testing Symposium, LOS ALAMITOS, IEEE, 2006, pp. v - 294 . [curatela]
X. Ma; J. Huang; C. Metra; F. Lombardi, Testing Reversible 1D Arrays of Molecular QCA, in: Proceedings of 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, LOS ALAMITOS, N. Park, H. Ito, A. Salsano, N. Touba, 2006, 1, pp. 71 - 79 (atti di: 21st IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, Washington DC, USA, 4-6 October, 2006) [Contributo in Atti di convegno]
J. C. Lo; C. Metra; F. Lombardi, Transactions on Computers, LOS ALAMITOS, IEEE, 2006, pp. 145 (Special Issue on Design and Test of Systems-On-a-Chip (SOC)). [curatela]
C. Metra; M. Nicolaidis; R. Leveugle; R. Aitken, Welcome, in: C. METRA M. NICOLAIDIS R. LEVEUGLE R. AITKEN, Proceeding 12th IEEE International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, M. Nicolaidis, R. Leveugle, R. Aitken, 2006, pp. ix - ix [introduzione]
C. Metra; M. Nicolaidis; R. Leveugle; R. Aitken, 12th IEEE International On-Line Testing Symposium, 2006. [mostra o esposizione]
A. K. Nieuwland; A. Katoch; D. Rossi; C. Metra, Coding Techniques for Low Switching Noise in Fault Tolerant Busses, in: Proceedings 11th International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, K. Roy, L. Anghel, M. Nicolaidis, 2005, pp. 183 - 189 (atti di: 11th International On-Line Testing Symposium, Saint Raphael, Francia, 6-8 luglio 2005) [Contributo in Atti di convegno]
D. Rossi; A. K. Nieuwland; A. Katoch; C. Metra, Exploiting ECC Redundancy to Minimize Crosstalk Impact, «IEEE DESIGN & TEST OF COMPUTERS», 2005, 22, pp. 59 - 70 [articolo]
C. Metra; R. Leveugle, Guest editorial, in: C. METRA R. LEVEUGLE, Journal of Electronic Testing, Special Issue on On-Line-Testing and Fault Tolerance, S.L., C. Metra, R. Leveugle, 2005, pp. 347 - 347 [introduzione]
C. Metra ; Regis Leveugle, Journal of Electronic Testing, S.L., C. Metra , Regis Leveugle, 2005, pp. 343 - 455 (Special Issue on Special Issue on On-Line-Testing and Fault Tolerance). [curatela]
Y. Dhillon; A. Diril; A. Chatterjee; C. Metra, Load and Logic Co-Optimization for design of Soft-Error Resistant nanometer CMOS Circuits, in: Proceedings 11th International On-Line Testing Symposium, LOS ALAMITOS, C. Metra, K. Roy, L. Anghel, M. Nicolaidis, 2005, pp. 35 - 40 (atti di: 11th International On-Line Testing Symposium, Saint Raphael, Francia, 6-8 luglio 2005) [Contributo in Atti di convegno]
M. Omaña; D. Rossi; C. Metra, Low Cost and High Speed Embedded Two-Rail Code Checker, «IEEE TRANSACTIONS ON COMPUTERS», 2005, 54, pp. 153 - 164 [articolo]
R. Aitken; C. Metra; H. Ito; N. Park, Message from the Symposium Chairs, in: R. AITKEN H. ITO C. METRA N. PARK, Proceeding of 20th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems, LOS ALAMITOS, R. Aitken, H. Ito, C. Metra, N. Park, 2005, pp. x - xi [introduzione]
