Andrea Natale Tallarico;Paolo Magnone;Giacomo Barletta;Angelo Magri;Enrico Sangiorgi;Claudio Fiegna, NBTI in p-channel power U-MOSFETs: Understanding the degradation and the recovery mechanisms2014 15th International Conference on Ultimate Integration on Silicon (ULIS), in: 2014 15th International Conference on Ultimate Integration on Silicon (ULIS), IEEE Computer Society, 2014, pp. 145 - 148 (atti di: International Conference on Ultimate Integration on Silicon, Stockholm, 7-9 April 2014) [Contribution to conference proceedings]
Andrea Natale Tallarico;Paolo Magnone;Giacomo Barletta;Angelo Magri;Enrico Sangiorgi;Claudio Fiegna, Negative Bias Temperature Stress Reliability in Trench-Gated P-Channel Power MOSFETs, «IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY», 2014, 14, pp. 657 - 663 [Scientific article]
