Söderström, Torsten; Soverini, Umberto, Aspects on errors-in-variables identification: Some ways to mitigate a large bias, in: Proceedings of the 22nd IFAC World Congress, 2023, 56, pp. 4019 - 4024 (atti di: 22nd IFAC World Congress, Yokohama, Japan, July 9-14, 2023) [Contribution to conference proceedings]
Söderström, Torsten; Soverini, Umberto, Analyzing the parameter bias when an ARMAX model is fitted to noise-corrupted data, Department of Information Technology, Uppsala University, 2022, pp. 12 . [Technical report]
Söderström, Tortsen; Soverini, Umberto, Analyzing the Parameter Bias when an Instrumental Variable Method is Used with Noise-Corrupted Data, Uppsala, Department of Information Technology, Uppsala University, 2022, pp. 15 . [Technical report]
Soderstrom, T; Soverini, U, When Are Errors-in-Variables Aspects Important to Consider in System Identification?, in: Proceedings 2022 European Control Conference (ECC), 345 E 47TH ST, NEW YORK, NY 10017 USA, IEEE, 2022, pp. 315 - 320 (atti di: 2022 European Control Conference (ECC), London, United Kingdom, July 12-15, 2022) [Contribution to conference proceedings]
Söderström, Torsten; Soverini, Umberto, When are errors-in-variables aspects particularly important to consider in system identification?, Uppsala, Department of Information Technology, Uppsala University, 2021, pp. 14 . [Technical report]
Soverini, Umberto; Söderström, Torsten, Blind identification of two–channel FIR systems: a frequency domain approach, in: Preprints of the 21st IFAC World Congress (Virtual), Elsevier, 2020, pp. 932 - 938 (atti di: IFAC World Congress, Berlin, July 11-17, 2020) [Contribution to conference proceedings]
Soverini, Umberto; Söderström, Torsten, Frequency domain identification of FIR models in the presence of additive input–output noise, «AUTOMATICA», 2020, 115, Article number: 108879 , pp. 1 - 10 [Scientific article]Open Access
Soverini, Umberto; Söderström, Torsten, The Frisch scheme for EIV system identification: time and frequency domain formulations, in: Preprints of the 21st IFAC World Congress (Virtual), Elsevier, 2020, 53, pp. 907 - 913 (atti di: IFAC World Congress, Berlin, July 11-17, 2020) [Contribution to conference proceedings]
Verbeke, Dieter; Söderström, Torsten; Soverini, Umberto, A note on the estimation of real- and complex-valued parameters in frequency domain maximum likelihood identification, «AUTOMATICA», 2019, 110, Article number: 108584 , pp. 1 - 3 [Scientific article]
Soverini, Umberto; Söderström, Torsten, Frequency domain identification of FIR models from noisy input-output data, Uppsala, Department of Information Technology, Uppsala University, 2019, pp. 13 . [Technical report]
Soverini, Umberto; Söderström, Torsten, The Frisch scheme: time and frequency domain aspects, Uppsala, Department of Information Technology, Uppsala University, 2019, pp. 12 . [Technical report]
Soverini, Umberto; Söderström, Torsten, Identification of two dimensional complex sinusoids in white noise: a state-space frequency approach, in: Preprints of the 18-th IFAC Symposium on System Identification, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, Elsevier B.V., 2018, 51, pp. 996 - 1001 (atti di: SYSID - IFAC Symposium on System Identification, Stockholm, 9-11 July 2018) [Contribution to conference proceedings]
Soverini Umberto; Söderström Torsten, Identification of two-dimensional complex sinusoids in white noise: a state-space frequency approach, Uppsala, Department of Information Technology, Uppsala University, 2018, pp. 7 . [Technical report]
Soverini Umberto; Söderström Torsten, 2D-frequency domain identification of complex sinusoids in the presence of additive noise, Uppsala, Department of Information Technology, Uppsala University, 2018, pp. 7 . [Technical report]
Soverini, Umberto; Söderström, Torsten, 2D-frequency domain identification of complex sinusoids in the presence of additive noise, in: Preprints of the 18-th IFAC Symposium on System Identification, PO BOX 211, 1000 AE AMSTERDAM, NETHERLANDS, Elsevier B.V., 2018, 51, pp. 820 - 825 (atti di: SYSID - IFAC Symposium on System Identification, Stockholm, 9-11 July 2018) [Contribution to conference proceedings]
