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Massimo Lanzoni

Associate Professor

Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"

Academic discipline: ING-INF/01 Electronic Engineering

Curriculum vitae

Prof. Massimo Lanzoni was born in Bologna (Italy) on August 9th 1961. He received the ``Laurea in Ingegneria Elettronica'' from the University of Bologna in 1987.

Since then he has been with the Microelectronics Research Group at the Department of Electronics at the same University working on research projects in the fields of the experimental characterization and simulation of NV memory cells and MOS devices, automatic test of VLSI devices and advanced instrumentation.

In particular his scientific interests cover the characterization of thin dielectrics reliability, non-volatile memory cell characteristics and reliability, MOS transistors experimental characterization and new techniques for IC testing as NV memories endurance testing and CMOS IC latch-up testing, modern instrumentation, advanced sensors and sensor networks.
He is now involved in projects concerning applications of advanced instrumentation and electronic design for industral and biomedical applications.

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