M. Rudan; S. Reggiani; E. Gnani; G. Baccarani; C. Corvasce; M. Ciappa; M. Stecher; D. Pogany; E. Gornik, Physical Models for Smart-Power Devices, in: Proceedings of the 13th International Conference on Mixed Design of Integrated Circuits and Systems (MIXDESS 2006), GDYNIA, s.n, 2006, pp. 28 - 33 (atti di: 13th International Conference on Mixed Design of Integrated Circuits and Systems” (MIXDESS 2006), Gdynia, Poland, June 22-24) [Contributo in Atti di convegno]
E. Gnani; A. Marchi; S. Reggiani; M. Rudan; G. Baccarani, Quantum mechanical analysis of the electrostatics in silicon nanowires and carbon nanotubes FETs, «SOLID-STATE ELECTRONICS», 2006, 50, pp. 709 - 717 [articolo]
Rudan M.; Reggiani S.; Gnani E.; Baccarani G.; Corvasce C.; Barlini D.; Ciappa M.; Fichtner W.; Denison M.; Jensen N.; Groos G.; Stecher M., Theory and experimental validation of a new analytical model for the position-dependent Hall Voltage in devices with arbitrary aspect ratio, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2006, 53, pp. 314 - 322 [articolo]
M. RUDAN; E. GNANI; S. REGGIANI; G. BACCARANI, A Coherent Extension of the Transport Equations in Semiconductors Incorporating the Quantum Correction: Part I – Single Particle Dynamics, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2005, 4, pp. 495 - 502 [articolo]
M. RUDAN; E. GNANI; S. REGGIANI; BACCARANI G., A Coherent Extension of the Transport Equations in Semiconductors Incorporating the Quantum Correction: Part II – Collective Transport, «IEEE TRANSACTIONS ON NANOTECHNOLOGY», 2005, 4, pp. 503 - 509 [articolo]
S. Reggiani; E. Gnani; M. Rudan; G. Baccarani; S. Bychikhin; J. Kuzmik; D. Pogany; E. Gornik; M. Denison; N. Jensen; G. Groos; M. Stecher, A new numerical and experimental analysis tool for ESD devices by means of the transient interferometric technique, «IEEE ELECTRON DEVICE LETTERS», 2005, 26, pp. 916 - 918 [articolo]
E. Gnani; S. Reggiani; M. Rudan; G. Baccarani, A quantum mechanical analysis of the electrostatics in multiple-gate FETs, in: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2005), TOKYO, IEEE EDS Japan Chapter, 2005, pp. 291 - 294 (atti di: International Conference on Simulation of Semiconductor Processes and Devices (SISPAD 2005), Tokyo, Japan, 1-3 Settembre 2005) [Contributo in Atti di convegno]
M. Rudan; S. Reggiani; E. Gnani; G. Baccarani; C. Corvasce; D. Barlini; M. Ciappa; W. Fichtner; M. Denison; N. Jensen; G. Groos; M. Stecher, Experimental validation of a new analytical model for the position-dependent Hall voltage in semiconductor devices, in: M. BRILLOUET, S. CRISTOLOVEANU, G. GHIBAUDO, T. SKOTNICKI, Proceedings of ESSDERC 2005, GRENOBLE, s.n, 2005(atti di: European Solid-State Device Research Conference, Grenoble, 13-15 Settembre 2005) [Contributo in Atti di convegno]
A. Marchi; E. Gnani; S. Reggiani; M. Rudan; G. Baccarani, Investigating the performance limits of silicon nanowires and carbon nanotube FETs, in: ULIS 2005, BOLOGNA, s.n, 2005(atti di: 6th International Conference on Ultimate Integration of Silicon (ULIS 2005), Bologna, 7-9 Aprile 2005) [Contributo in Atti di convegno]
S. Reggiani; E. Gnani; M. Rudan; G. Baccarani; C. Corvasce; D. Barlini; M. Ciappa; W. Fichtner; M. Denison; N. Jensen; G. Groos; M. Stecher, Measurement and modeling of the electron impact-ionization coefficient in silicon up to very high temperatures, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2005, 52, pp. 2290 - 2299 [articolo]
G. BACCARANI; E. GNANI, Memory Devices: Part I – Volatile Memories, in: ENCYCLPEDIA OF CONDENSED MATTER PHYSICS, OXFORD, Elsevier, 2005, pp. 1621 - 1622 [capitolo di libro]
G. BACCARANI; E. GNANI, Memory Devices: Part II – Non-Volatile Memories, in: F. BASSANI; J. LIEDL; P. WYDER, ENCYCLOPEDIA OF CONDENSED MATTER PHYSICS, OXFORD, Elsevier, 2005, pp. 1623 - 1636 (Encyclopedia of Condensed Matter Physiscs) [capitolo di libro]
E. Gnani; S. Reggiani; M. Rudan; G. Baccarani, On the Electrostatics of Double-Gate and Cylindrical Nanowire MOSFETs, «JOURNAL OF COMPUTATIONAL ELECTRONICS», 2005, 4, pp. 71 - 74 [articolo]
S. Reggiani; E. Gnani; M. Rudan; G. Baccarani; S. Bychikhin; J. Kuzmik; D. Pogany; E. Gornik; M. Denison; N. Jensen; G. Groos; M. Stecher, Predictive device simulation for ESD protection structures validated with transient interferometric thermal-mapping experiments, in: Proceedings of the European Solid-State Device Research Conference (ESSDERC 2005), GRENOBLE, s.n, 2005, pp. 411 - 414 (atti di: European Solid-State Device Research Conference (ESSDERC 2005), Grenoble, 11-15 Settembre 2005) [Contributo in Atti di convegno]
E. Gnani; A. Marchi; S. Reggiani; M. Rudan; G. Baccarani, Quantum-mechanical analysis of the electrostatics in silicon-nanowire and carbon-nanotube FETs, in: Proceedings of the European Solid-State Device Research Conference (ESSDERC 2005), GRENOBLE, s.n, 2005, pp. 161 - 164 (atti di: European Solid-State Device Research Conference (ESSDERC 2005), Grenoble, 13-15 Settembre 2005) [Contributo in Atti di convegno]
