Foto del docente

Gian Piero Gibiino

Junior assistant professor (fixed-term)

Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"

Academic discipline: ING-INF/07 Electrical and Electronic Measurement

Publications

Martin-Guerrero T.; Camacho-Penalosa C.; Santarelli A.; Gibiino G.P.; Traverso P.A.; Filicori F., Nonlinear FET modeling from a single NVNA measurement by nonlinear function sampling, in: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2020 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 1 - 3 (atti di: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2020, gbr, 2020) [Contribution to conference proceedings]

Mengozzi M.; Gibiino G.P.; Angelotti A.M.; Florian C.; Santarelli A., Supply-Modulated PA Performance Enhancement by Joint Optimization of RF Input and Supply Control, in: Asia-Pacific Microwave Conference Proceedings, APMC, Institute of Electrical and Electronics Engineers Inc., 2020, 2020-, pp. 585 - 587 (atti di: 2020 Asia-Pacific Microwave Conference, APMC 2020, Hong Kong, 2020) [Contribution to conference proceedings]

Gibiino G.P.; Angelotti A.M.; Santarelli A.; Traverso P.A., VNA-based broadband EVM measurement of an RF nonlinear PA under load mismatch conditions, in: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, International Measurement Confederation (IMEKO), 2020, pp. 65 - 69 (atti di: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, IWADC 2020, ita, 2020) [Contribution to conference proceedings]

Crescentini M.; Biondi M.; Ramilli R.; Traverso P.A.; Gibiino G.P.; Romani A.; Tartagni M.; Marchesi M.; Canegallo R., A broadband current sensor based on the X-Hall architecture, in: 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Institute of Electrical and Electronics Engineers Inc., 2019, pp. 807 - 810 (atti di: 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genova, Italia, NOV 27-29, 2019) [Contribution to conference proceedings]Open Access

Gibiino G.P.; Santarelli A.; Filicori F., Charge-conservative GaN HEMT nonlinear modeling from non-isodynamic multi-bias S-parameter measurements, «INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES», 2019, 11, pp. 431 - 440 [Scientific article]

Gibiino G.P.; Santarelli A.; Cignani R.; Traverso P.A.; Filicori F., Measurement-Based Automatic Extraction of FET Parasitic Network by Linear Regression, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2019, 29, pp. 598 - 600 [Scientific article]

Gibiino G.P.; Angelotti A.M.; Santarelli A.; Florian C., Microwave Characterization of Trapping Effects in 100-nm GaN-on-Si HEMT Technology, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2019, 29, pp. 604 - 606 [Scientific article]

Angelotti A.M.; Gibiino G.P.; Florian C.; Santarelli A., Narrow-pulse-width double-pulsed S-parameters measurements of 100-nm GaN-on-Si HEMTs, in: EuMIC 2019 - 2019 14th European Microwave Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 2019, pp. 17 - 20 (atti di: 14th European Microwave Integrated Circuits Conference, EuMIC 2019, Paris, France, 2019) [Contribution to conference proceedings]

Gibiino, G.P.; Cignani, R.; Santarelli, A.; Traverso, P.A., A bias network for small duty-cycle fast-pulsed measurement of RF power transistors, in: Journal of Physics: Conference Series, Institute of Physics Publishing, «JOURNAL OF PHYSICS. CONFERENCE SERIES», 2018, 1065, pp. 1 - 4 (atti di: 22nd World Congress of the International Measurement Confederation, IMEKO 2018, Belfast Waterfront Conference and Exhibition Centre, gbr, 2018) [Contribution to conference proceedings]

Gibiino, Gian Piero*; Santarelli, Alberto; Filicori, Fabio, A GaN HEMT Global Large-Signal Model Including Charge Trapping for Multibias Operation, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2018, 66, pp. 4684 - 4697 [Scientific article]

Kowalski, T., Dabek, B., Gibiino, G.P., Habib, S.B., Barmuta, P., A measurement setup for digital predistortion using direct RF undersampling, in: Kowalski, Tomasz, MIKON 2018 - 22nd International Microwave and Radar Conference, Institute of Electrical and Electronics Engineers Inc., 2018, pp. 438 - 439 (atti di: 22nd International Microwave and Radar Conference, MIKON 2018, Poznan, Poland, 2018) [Contribution to conference proceedings]

Gian Piero, Gibiino; Santarelli, Alberto; Filicori, Fabio, A Procedure for GaN HEMT Charge Functions Extraction from Multi-Bias S-Parameters, in: EuMIC 2018 - 2018 13th European Microwave Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 2018, pp. 65 - 68 (atti di: 13th European Microwave Integrated Circuits Conference, EuMIC 2018, esp, 2018) [Contribution to conference proceedings]

Gibiino, Gian Piero; Lukasik, Konstanty; Barmuta, Pawel; Santarelli, Alberto; Schreurs, Dominique M. M. -P.; Filicori, Fabio, A Two-Port Nonlinear Dynamic Behavioral Model of RF PAs Subject to Wideband Load Modulation, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2018, 66, pp. 831 - 844 [Scientific article]

Florian, C., Gibiino, G.P., Santarelli, A., Assessment of the Trap-Induced Insertion Loss Degradation of RF GaN Switches under Operating Regimes, in: Florian, Corrado, IEEE MTT-S International Microwave Symposium Digest, Institute of Electrical and Electronics Engineers Inc., «IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST», 2018, 2018-, pp. 732 - 735 (atti di: 2018 IEEE/MTT-S International Microwave Symposium, IMS 2018, usa, 2018) [Contribution to conference proceedings]

Florian, Corrado; Gibiino, Gian Piero; Santarelli, Alberto, Characterization and Modeling of RF GaN Switches Accounting for Trap-Induced Degradation Under Operating Regimes, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2018, 66, pp. 5491 - 5500 [Scientific article]

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