Research fellow
Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"
Academic discipline: ING-INF/01 Electronic Engineering
Volosov V.; Cascino S.; Saggio M.; Imbruglia A.; Di Giovanni F.; Fiegna C.; Sangiorgi E.; Tallarico A.N., Role of interface/border traps on the threshold voltage instability of SiC power transistors, «SOLID-STATE ELECTRONICS», 2023, 207, Article number: 108699 , pp. 1 - 4 [Scientific article]Open Access
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