Dadi, M.; Franco, A.; Lumini, A., Rootex 2.0: Multi-head deep learning and graph-based analysis for automated barley root phenotyping, «EXPERT SYSTEMS WITH APPLICATIONS», 2026, 299, Article number: 129930 , pp. 1 - 19 [Scientific article]
Botazzo Rozendo, G.; Dadi, M.; Franco, A.; Lumini, A., Cattle weight estimation using 2D side-view images and estimated depth-based 3D modeling, «SMART AGRICULTURAL TECHNOLOGY», 2025, 12, Article number: 101099 , pp. 1 - 13 [Scientific article]Open Access
Lumini, Alessandra; Botazzo Rozendo, Guilherme; Dadi, Maichol; Franco, Annalisa, Comparison of CNN and Transformer Architectures for Robust Cattle Segmentation in Complex Farm Environments, in: Proceedings of the 14th International Conference on Pattern Recognition Applications and Methods - ICPRAM, SciTePress, 2025, pp. 91 - 102 (atti di: 14th International Conference on Pattern Recognition Applications and Methods, Porto, Portugal, February 23-25, 2025) [Contribution to conference proceedings]
Dadi, Maichol; Lumini, Alessandra; Franco, Annalisa, RootEx: An automated method for barley root system extraction and evaluation, «COMPUTERS AND ELECTRONICS IN AGRICULTURE», 2025, 230, Article number: 110030 , pp. 1 - 14 [Scientific article]Open Access
Dadi, M.; Franco, A.; Sangiorgi, G.; Salvi, S.; Lumini, A., RootTracer: An intuitive solution for root image annotation, «SMART AGRICULTURAL TECHNOLOGY», 2025, 10, Article number: 100705 , pp. 1 - 9 [Scientific article]Open Access
Dadi, M.; Lumini, A.; Franco, A.; Sangiorgi, G., Deep learning for Root System Extraction from Barley Plants, in: 2024 14th International Conference on Pattern Recognition Systems, ICPRS 2024, 345 E 47TH ST, NEW YORK, NY 10017 USA, Institute of Electrical and Electronics Engineers Inc., 2024, pp. 1 - 6 (atti di: 14th International Conference on Pattern Recognition Systems, ICPRS 2024, gbr, 2024) [Contribution to conference proceedings]
Dadi, Maichol; Franco, Annalisa; Maltoni, Davide, Supporting Human Examiners in Facial Image Manipulation Detection, in: 2024 IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), New York, IEEE, 2024, pp. 710 - 715 (atti di: IEEE International Conference on Metrology for eXtended Reality, Artificial Intelligence and Neural Engineering (MetroXRAINE), St. Albans, United Kingdom, 22-24 Ottobre 2024) [Contribution to conference proceedings]Open Access
