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L. Balestra, S. Reggiani, A. Gnudi, E. Gnani, G. Baccarani, J. Dobrzynska, J. Vobecky:
"Numerical Investigation of the Leakage Current and Blocking Capabilities of High-Power Diodes with Doped DLC Passivation Layers [http://in4.iue.tuwien.ac.at/pdfs/sispad2019/SISPAD_8.1.pdf]";
Talk: SISPAD, Udine, Italien; 2019-09-04 - 2019-09-06; in: "Proc. of SISPAD", (2019), 978-1-7281-0939-8; 243 - 246.
Reggiani, S., Balestra, L., Gnudi, A., Gnani, E., Baccarani, G., Dobrzynska, J., ... & Tosi, C. (2019). TCAD Investigation of Differently-Doped DLC Passivation for Large-Area High-Power Diodes. IEEE Journal of Emerging and Selected Topics in Power Electronics.
Reggiani, S., Balestra, L., Gnudi, A., Gnani, E., Baccarani, G., Dobrzynska, J., ... & Tosi, C. (2018). TCAD study of DLC coatings for large-area high-power diodes. Microelectronics Reliability, 88, 1094-1097.
