Martin-Guerrero, T. M.; Santarelli, A.; Gibiino, G. P.; Traverso, P. A.; Camacho-Penalosa, C.; Filicori, F., Measurement-Based FET Analytical Modeling Using the Nonlinear Function Sampling Approach, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2020, 30, Article number: 9224715, pp. 1145 - 1148 [articolo]Open Access
Gibiino G.P.; Angelotti A. M.; Santarelli A.; Filicori F.; Traverso P.A., M2s parameters: A multi-tone multi-harmonic measurement approach for the characterization of nonlinear networks, in: I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 1 - 6 (atti di: 2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020, Dubrovnik; Croatia, 2020) [Contributo in Atti di convegno]
Martin-Guerrero T.; Camacho-Penalosa C.; Santarelli A.; Gibiino G.P.; Traverso P.A.; Filicori F., Nonlinear FET modeling from a single NVNA measurement by nonlinear function sampling, in: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2020 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 1 - 3 (atti di: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2020, gbr, 2020) [Contributo in Atti di convegno]
Mengozzi M.; Gibiino G.P.; Angelotti A.M.; Florian C.; Santarelli A., Supply-Modulated PA Performance Enhancement by Joint Optimization of RF Input and Supply Control, in: Asia-Pacific Microwave Conference Proceedings, APMC, Institute of Electrical and Electronics Engineers Inc., 2020, 2020-, pp. 585 - 587 (atti di: 2020 Asia-Pacific Microwave Conference, APMC 2020, Hong Kong, 2020) [Contributo in Atti di convegno]
Gibiino G.P.; Angelotti A.M.; Santarelli A.; Traverso P.A., VNA-based broadband EVM measurement of an RF nonlinear PA under load mismatch conditions, in: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, International Measurement Confederation (IMEKO), 2020, pp. 65 - 69 (atti di: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, IWADC 2020, ita, 2020) [Contributo in Atti di convegno]
Crescentini M.; Biondi M.; Ramilli R.; Traverso P.A.; Gibiino G.P.; Romani A.; Tartagni M.; Marchesi M.; Canegallo R., A broadband current sensor based on the X-Hall architecture, in: 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Institute of Electrical and Electronics Engineers Inc., 2019, pp. 807 - 810 (atti di: 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genova, Italia, NOV 27-29, 2019) [Contributo in Atti di convegno]Open Access
Gibiino G.P.; Santarelli A.; Filicori F., Charge-conservative GaN HEMT nonlinear modeling from non-isodynamic multi-bias S-parameter measurements, «INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES», 2019, 11, pp. 431 - 440 [articolo]
Gibiino G.P.; Santarelli A.; Cignani R.; Traverso P.A.; Filicori F., Measurement-Based Automatic Extraction of FET Parasitic Network by Linear Regression, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2019, 29, Article number: 8804362, pp. 598 - 600 [articolo]
Gibiino, G. P.; Angelotti, A. M.; Santarelli, A.; Florian, C., Microwave Characterization of Trapping Effects in 100-nm GaN-on-Si HEMT Technology, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2019, 29, Article number: 8805159, pp. 604 - 606 [articolo]
Angelotti A.M.; Gibiino G.P.; Florian C.; Santarelli A., Narrow-pulse-width double-pulsed S-parameters measurements of 100-nm GaN-on-Si HEMTs, in: EuMIC 2019 - 2019 14th European Microwave Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 2019, pp. 17 - 20 (atti di: 14th European Microwave Integrated Circuits Conference, EuMIC 2019, Paris, France, 2019) [Contributo in Atti di convegno]
Gibiino, G.P.; Cignani, R.; Santarelli, A.; Traverso, P.A., A bias network for small duty-cycle fast-pulsed measurement of RF power transistors, in: Journal of Physics: Conference Series, Institute of Physics Publishing, 2018, 1065, pp. 1 - 4 (atti di: 22nd World Congress of the International Measurement Confederation, IMEKO 2018, Belfast Waterfront Conference and Exhibition Centre, gbr, 2018) [Contributo in Atti di convegno]
Gibiino, Gian Piero*; Santarelli, Alberto; Filicori, Fabio, A GaN HEMT Global Large-Signal Model Including Charge Trapping for Multibias Operation, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2018, 66, Article number: 8428425, pp. 4684 - 4697 [articolo]
Kowalski, T., Dabek, B., Gibiino, G.P., Habib, S.B., Barmuta, P., A measurement setup for digital predistortion using direct RF undersampling, in: Kowalski, Tomasz, MIKON 2018 - 22nd International Microwave and Radar Conference, Institute of Electrical and Electronics Engineers Inc., 2018, pp. 438 - 439 (atti di: 22nd International Microwave and Radar Conference, MIKON 2018, Poznan, Poland, 2018) [Contributo in Atti di convegno]
Gian Piero, Gibiino; Santarelli, Alberto; Filicori, Fabio, A Procedure for GaN HEMT Charge Functions Extraction from Multi-Bias S-Parameters, in: EuMIC 2018 - 2018 13th European Microwave Integrated Circuits Conference, Institute of Electrical and Electronics Engineers Inc., 2018, pp. 65 - 68 (atti di: 13th European Microwave Integrated Circuits Conference, EuMIC 2018, esp, 2018) [Contributo in Atti di convegno]
Gibiino, Gian Piero*; Lukasik, Konstanty; Barmuta, Pawel; Santarelli, Alberto; Schreurs, Dominique M. M.-P.; Filicori, Fabio, A Two-Port Nonlinear Dynamic Behavioral Model of RF PAs Subject to Wideband Load Modulation, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2018, 66, Article number: 8080311, pp. 831 - 844 [articolo]
