Foto del docente

Gian Piero Gibiino

Ricercatore a tempo determinato tipo b) (senior)

Dipartimento di Ingegneria dell'Energia Elettrica e dell'Informazione "Guglielmo Marconi"

Settore scientifico disciplinare: ING-INF/07 MISURE ELETTRICHE E ELETTRONICHE

Pubblicazioni

Angelotti A.M.; Gibiino G.P.; Florian C.; Santarelli A., Broadband error vector magnitude characterization of a GaN power amplifier using a vector network analyzer, in: IEEE MTT-S International Microwave Symposium Digest, Institute of Electrical and Electronics Engineers Inc., «IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST», 2020, 2020-, pp. 747 - 750 (atti di: 2020 IEEE/MTT-S International Microwave Symposium, IMS 2020, usa, 2020) [Contributo in Atti di convegno]

Kowalski T.; Gibiino G.P.; Barmuta P.; Szewinski J.; Traverso P.A., Digital post-distortion of an ADC analog front-end for gamma spectroscopy measurements, in: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, International Measurement Confederation (IMEKO), 2020, pp. 141 - 145 (atti di: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, IWADC 2020, ita, 2020) [Contributo in Atti di convegno]

Angelotti A.M.; Gibiino G.P.; Santarelli A., Efficient implementation of a modified-Volterra radio-frequency power amplifier nonlinear dynamic model by global rational functions approximation, «INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING», 2020, 30, Article number: e22392, pp. 1 - 13 [articolo]

Angelotti A.M.; Gibiino G.P.; Nielsen T.S.; Schreurs D.; Santarelli A., Enhanced wideband active load-pull with a vector network analyzer using modulated excitations and device output match compensation, in: IEEE MTT-S International Microwave Symposium Digest, Institute of Electrical and Electronics Engineers Inc., «IEEE MTT-S INTERNATIONAL MICROWAVE SYMPOSIUM DIGEST», 2020, 2020-, pp. 763 - 766 (atti di: 2020 IEEE/MTT-S International Microwave Symposium, IMS 2020, usa, 2020) [Contributo in Atti di convegno]

Crescentini M.; Ramilli R.; Gibiino G.P.; Marchesi M.; Canegallo R.; Romani A.; Tartagni M.; Traverso P.A., Experimental assessment of a broadband current sensor based on the x-hall architecture, in: I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings, Institute of Electrical and Electronics Engineers Inc., «... IEEE INTERNATIONAL INSTRUMENTATION AND MEASUREMENT TECHNOLOGY CONFERENCE.», 2020, pp. 1 - 6 (atti di: 2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020, Dubrovnik, Croatia, 25-28 May 2020) [Contributo in Atti di convegno]Open Access

Angelotti A.M.; Gibiino G.P.; Santarelli A.; Florian C., Experimental Characterization of Charge Trapping Dynamics in 100-nm AlN/GaN/AlGaN-on-Si HEMTs by Wideband Transient Measurements, «IEEE TRANSACTIONS ON ELECTRON DEVICES», 2020, 67, Article number: 9123568, pp. 3069 - 3074 [articolo]Open Access

Martin-Guerrero T.M.; Santarelli A.; Gibiino G.P.; Traverso P.A.; Camacho-Penalosa C.; Filicori F., Measurement-Based FET Analytical Modeling Using the Nonlinear Function Sampling Approach, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2020, 30, Article number: 9224715, pp. 1145 - 1148 [articolo]

Gibiino G.P.; Angelotti A. M.; Santarelli A.; Filicori F.; Traverso P.A., M2s parameters: A multi-tone multi-harmonic measurement approach for the characterization of nonlinear networks, in: I2MTC 2020 - International Instrumentation and Measurement Technology Conference, Proceedings, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 1 - 6 (atti di: 2020 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2020, Dubrovnik; Croatia, 2020) [Contributo in Atti di convegno]

Martin-Guerrero T.; Camacho-Penalosa C.; Santarelli A.; Gibiino G.P.; Traverso P.A.; Filicori F., Nonlinear FET modeling from a single NVNA measurement by nonlinear function sampling, in: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2020 - Proceedings, Institute of Electrical and Electronics Engineers Inc., 2020, pp. 1 - 3 (atti di: 2020 International Workshop on Integrated Nonlinear Microwave and Millimetre-Wave Circuits, INMMiC 2020, gbr, 2020) [Contributo in Atti di convegno]

Mengozzi M.; Gibiino G.P.; Angelotti A.M.; Florian C.; Santarelli A., Supply-Modulated PA Performance Enhancement by Joint Optimization of RF Input and Supply Control, in: Asia-Pacific Microwave Conference Proceedings, APMC, Institute of Electrical and Electronics Engineers Inc., 2020, 2020-, pp. 585 - 587 (atti di: 2020 Asia-Pacific Microwave Conference, APMC 2020, Hong Kong, 2020) [Contributo in Atti di convegno]

Gibiino G.P.; Angelotti A.M.; Santarelli A.; Traverso P.A., VNA-based broadband EVM measurement of an RF nonlinear PA under load mismatch conditions, in: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, International Measurement Confederation (IMEKO), 2020, pp. 65 - 69 (atti di: 24th IMEKO TC4 International Symposium and 22nd International Workshop on ADC and DAC Modelling and Testing, IWADC 2020, ita, 2020) [Contributo in Atti di convegno]

Crescentini M.; Biondi M.; Ramilli R.; Traverso P.A.; Gibiino G.P.; Romani A.; Tartagni M.; Marchesi M.; Canegallo R., A broadband current sensor based on the X-Hall architecture, in: 2019 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Institute of Electrical and Electronics Engineers Inc., 2019, pp. 807 - 810 (atti di: 26th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2019, Genova, Italia, NOV 27-29, 2019) [Contributo in Atti di convegno]Open Access

Gibiino G.P.; Santarelli A.; Filicori F., Charge-conservative GaN HEMT nonlinear modeling from non-isodynamic multi-bias S-parameter measurements, «INTERNATIONAL JOURNAL OF MICROWAVE AND WIRELESS TECHNOLOGIES», 2019, 11, pp. 431 - 440 [articolo]

Gibiino G.P.; Santarelli A.; Cignani R.; Traverso P.A.; Filicori F., Measurement-Based Automatic Extraction of FET Parasitic Network by Linear Regression, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2019, 29, Article number: 8804362, pp. 598 - 600 [articolo]

Gibiino G.P.; Angelotti A.M.; Santarelli A.; Florian C., Microwave Characterization of Trapping Effects in 100-nm GaN-on-Si HEMT Technology, «IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS», 2019, 29, Article number: 8805159, pp. 604 - 606 [articolo]

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