M. Malvestuto; F. Boscherini, Local atomic environment of high-k oxides on silicon probed by x-ray absorption spectroscopy, in: Rare Earth Oxide Thin Films, BERLIN, Springer, 2007, pp. 143 - 152 (Topics in Applied Physics) [Chapter or essay]
T. Cesca; G. Mattei; A. Gasparotto; B. Fraboni; F.Boscherini; M.Longo; L.Tarricone, Local structure of Fe incorporated in GaInP layers by high temperature ion implantation, «NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH. SECTION B, BEAM INTERACTIONS WITH MATERIALS AND ATOMS», 2007, 257, pp. 332 - 335 [Scientific article]
F. Boscherini; D. De Salvador;G. Bisognin; G. Ciatto, New opportunities to study defects by soft X-ray absorption fine structure, in: Gettering and defect engineering in semiconductor technology XII, ZURIGO, Trans Tech Publications, 2007, pp. 473 - 478 (atti di: Gettering and defect engineering in semiconductor technology XII, Erice, 14-19 ottobre 2007) [Contribution to conference proceedings]
T. Cesca; A. Gasparotto; G. Mattei; B. Fraboni; F. Boscherini; G.Impellizzeri; F.Priolo; M. Longo; L. Tarricone, Structural and electrical characterization of Fe implanted GaInP, in: Proceedings of MRS Conference "Symposium F: Semiconductor Defect Engineering--Materials, Synthetic Structures, and Devices II", SAN FRANCISCO, s.n, 2007(atti di: Symposium F: Semiconductor Defect Engineering--Materials, Synthetic Structures, and Devices II, San Francisco, U.S.A., marzo 2007) [Contribution to conference proceedings]
P. Luches; V. Bellini; S. Colonna; L. Di Giustino; F. Manghi; S. Valeri; F. Boscherini, Structure at the Fe/NiO(001) interface probed by polarization dependent XAFS, in: ESRF Highlights 2006, GRENOBLE, European Synchrotron Radiation Facility, 2007, pp. 86 - 87 (ESRF Highlights) [Chapter or essay]
M. Katsikini ; F. Pinakidou; E. C. Paloura; F. Boscherini, Study of the modification of the microstructure of GaN after high – dose Si implantation, «JOURNAL OF APPLIED PHYSICS», 2007, 101, pp. 083510 - 083516 [Scientific article]
F. Francia; L. Giachini; F. Boscherini; G. Venturoli; G. Capitanio; P.L. Martino; S. Papa, The inhibitory binding site(s) of Zn2+ in cytochrome c oxidase, «FEBS LETTERS», 2007, 581, pp. 611 - 616 [Scientific article]
Coordination of a Research Project: Trehalose-induced elimination of x-ray damage in the bacterial
photosynthetic reaction center. SC-2211..
F. Boscherini; P. Fons; D. De Salvador; G. Bisognin; G. Ciatto, XANES studies of low-z dopants and defects in semiconductors, in: ELETTRA Highlights 2006-07, TRIESTE, Sincrotrone Trieste, 2007, pp. 46 - 47 [Chapter or essay]
F Boscherini; M Malvestuto; G Ciatto; F D’Acapito; G Bisognin; D. De Salvador; M. Berti; M Felici; A Polimeni; Y Nabetani, X-ray absorption and diffraction study of II-VI dilute oxide semiconductor alloy epilayers, «JOURNAL OF PHYSICS. CONDENSED MATTER», 2007, 19, pp. 446201-1 - 446201-12 [Scientific article]
L. Giachini; F. Francia; G. Veronesi; D.W. Lee; F. Daldal; L.S. Huang; E.A. Berry; T. Cocco; S. Papa; F. Boscherini; G. Venturoli, X-ray absorption studies of Zn2+ binding sites in bacterial, avian, and bovine cytochrome bc1 complexes, «BIOPHYSICAL JOURNAL», 2007, 93, pp. 2934 - 2951 [Scientific article]
Coordination of a Research Project: Atomic environment of Fe at the early stages of self-assembly on MgO.
G. Ciatto; F. Boscherini; A. Amore Bonapasta; F. Filippone; A. Polimeni; M. Capizzi, C2v nitrogen – hydrogen complexes in GaAsN revealed by X-ray absorption near edge spectroscopy and ab – initio simulations, «PHYSICA STATUS SOLIDI. C», 2006, 3, pp. 1836 - 1840 [Scientific article]
P. Fons; H. Tampo; A.V. Kolobov; M.Ohkubo; S. Niki; J. Tominaga; R. Carboni; F. Boscherini; S. Friedrich, Direct observation of nitrogen location in molecular beam epitaxy grown nitrogen-doped ZnO, «PHYSICAL REVIEW LETTERS», 2006, 96, pp. 045504-1 - 045504-4 [Scientific article]
R. Oberti; S. Quartieri; M. C. Dalconi; F. Boscherini; G. Iezzi; M. Boiocchi, Distinct local environments for Ca along the non-ideal pyrope–grossular solid solution: A new model based on crystallographic and EXAFS analysis, «CHEMICAL GEOLOGY», 2006, 225, pp. 347 - 357 [Scientific article]
