Nadalini D.; Rusci M.; Tagliavini G.; Ravaglia L.; Benini L.; Conti F., PULP-TrainLib: Enabling On-Device Training for RISC-V Multi-core MCUs Through Performance-Driven Autotuning, in: Embedded Computer Systems: Architectures, Modeling, and Simulation, Springer, 2022, 13511, pp. 200 - 216 (atti di: 22nd International Conference, SAMOS 2022, Samos, Greece, July 3–7, 2022) [Contributo in Atti di convegno]Open Access
Benini, Luca, PULP: Extreme Energy Efficiency for Extreme Edge AI Acceleration, in: 2022 11th Mediterranean Conference on Embedded Computing (MECO), 2022, pp. 1 - 1 (atti di: 2022 11th Mediterranean Conference on Embedded Computing (MECO), Budva, Montenegro, 7-10 June 2022) [Contributo in Atti di convegno]
Kuhne, Jonas; Magno, Michele; Benini, Luca, Parallelizing Optical Flow Estimation on an Ultra-Low Power RISC-V Cluster for Nano-UAV Navigation, in: IEEE International Symposium on Circuits and Systems (ISCAS), 2022, pp. 301 - 305 (atti di: IEEE International Symposium on Circuits and Systems (ISCAS), Austin, Texas, May 27 - June 1) [Contributo in Atti di convegno]
Ficarelli F.; Bartolini A.; Parisi E.; Beneventi F.; Barchi F.; Gregori D.; Magugliani F.; Cicala M.; Gianfreda C.; Cesarini D.; Acquaviva A.; Benini L., Poster: Meet Monte Cimone: Exploring RISC-V High Performance Compute Clusters, in: ACM International Conference Proceeding Series, Association for Computing Machinery, 2022, pp. 207 - 208 (atti di: 19th ACM International Conference on Computing Frontiers, CF 2022, Castello del Valentino, ita, 2022) [Contributo in Atti di convegno]
Benini L.; Leroy Y.; Tolio T.; Magnanini M.C., Proposal of a strategic model to unlock the circular potential in industrial practice, in: Procedia CIRP, «PROCEDIA CIRP», 2022, 109, pp. 233 - 238 (atti di: ., ., .) [Contributo in Atti di convegno]Open Access
Tortorella, Yvan; Bertaccini, Luca; Rossi, Davide; Benini, Luca; Conti, Francesco, RedMulE: A Compact FP16 Matrix-Multiplication Accelerator for Adaptive Deep Learning on RISC-V-Based Ultra-Low-Power SoCs, in: DATE '22: Proceedings of the 2022 Conference & Exhibition on Design, Automation & Test in Europe, 2022, pp. 1099 - 1102 (atti di: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp, Belgium, 14-23 March 2022) [Contributo in Atti di convegno]
Thorir Mar Ingolfsson; Mark Vero; Xiaying Wang; Lorenzo Lamberti; Luca Benini; Matteo Spallanzani, Reducing neural architecture search spaces with training-free statistics and computational graph clustering, in: CF '22: Proceedings of the 19th ACM International Conference on Computing Frontiers, 2022, pp. 213 - 214 (atti di: 19th ACM International Conference on Computing Frontiers, Turin Italy, May 17 - 22, 2022) [Contributo in Atti di convegno]
Ardebili, Mohsen Seyedkazemi; Bartolini, Andrea; Acquaviva, Andrea; Benini, Luca, Rule-Based Thermal Anomaly Detection for Tier-0 HPC Systems, in: Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics), GEWERBESTRASSE 11, CHAM, CH-6330, SWITZERLAND, SPRINGER INTERNATIONAL PUBLISHING AG, «LECTURE NOTES IN COMPUTER SCIENCE», 2022, 13387 LNCS, pp. 262 - 276 (atti di: 37th International Conference on High Performance Computing , ISC High Performance 2022, Hamburg, 29 May 2022through 2 June 2022) [Contributo in Atti di convegno]
Alfio Di Mauro; Arpan Suravi Prasad; Zhikai Huang; Matteo Spallanzani; Francesco Conti; Luca Benini, SNE: an Energy-Proportional Digital Accelerator for Sparse Event-Based Convolutions, in: Proceedings of 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), IEEE, 2022, pp. 1 - 6 (atti di: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp, Belgium, 14-23 March 2022) [Contributo in Atti di convegno]Open Access
Bruschi N.; Tagliavini G.; Conti F.; Abadal S.; Cabellos-Aparicio A.; Alarcon E.; Karunaratne G.; Boybat I.; Benini L.; Rossi D., Scale up your In-Memory Accelerator: Leveraging Wireless-on-Chip Communication for AIMC-based CNN Inference, in: 2022 IEEE 4th International Conference on Artificial Intelligence Circuits and Systems (AICAS), 2022, pp. 170 - 173 (atti di: Artificial Intelligence Circuits and Systems (AICAS), Incheon, Korea, Republic of Korea, 13-15 June 2022) [Contributo in Atti di convegno]Open Access
Molan M.; Borghesi A.; Benini L.; Bartolini A., Semi-supervised anomaly detection on a Tier-0 HPC system, in: CF '22: Proceedings of the 19th ACM International Conference on Computing Frontiers, 2022, pp. 203 - 204 (atti di: CF '22 19th ACM International Conference on Computing Frontiers, Turin, Italy, May 17 - 22, 2022) [Contributo in Atti di convegno]
Paulin G.; Cavalcante M.; Scheffler P.; Bertaccini L.; Zhang Y.; Gurkaynak F.; Benini L., Soft Tiles: Capturing Physical Implementation Flexibility for Tightly-Coupled Parallel Processing Clusters, in: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), 2022, 2022-July, pp. 44 - 49 (atti di: 2022 IEEE Computer Society Annual Symposium on VLSI (ISVLSI), Nicosia, Cyprus, 04-06 July 2022) [Contributo in Atti di convegno]Open Access
Cavalcante, Matheus; Wüthrich, Domenic; Perotti, Matteo; Riedel, Samuel; Benini, Luca, Spatz: A Compact Vector Processing Unit for High-Performance and Energy-Efficient Shared-L1 Clusters, in: 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD), 345 E 47TH ST, NEW YORK, NY 10017 USA, IEEE, 2022, pp. 1 - 9 (atti di: 2022 IEEE/ACM International Conference On Computer Aided Design (ICCAD), San Diego, CA, USA, 29 October 2022 - 03 November 2022) [Contributo in Atti di convegno]
Gianmarco Cerutti; Lukas Cavigelli; Renzo Andri; Michele Magno; Elisabetta Farella; Luca Benini, Sub-mW Keyword Spotting on an MCU: Analog Binary Feature Extraction and Binary Neural Networks, «IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS. I, REGULAR PAPERS», 2022, 69, pp. 2002 - 2012 [articolo]
Rutishauser, G; Scherer, M; Fischer, T; Benini, L, Ternarized TCN for mu J/Inference Gesture Recognition from DVS Event Frames, in: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), NEW YORK, IEEE, «PROCEEDINGS - DESIGN, AUTOMATION, AND TEST IN EUROPE CONFERENCE AND EXHIBITION», 2022, pp. 736 - 741 (atti di: 2022 Design, Automation & Test in Europe Conference & Exhibition (DATE), Antwerp Belgium, 14-23 march 2022) [Contributo in Atti di convegno]Open Access
