Foto del docente

Alberto Santarelli

Associate Professor

Department of Electrical, Electronic, and Information Engineering "Guglielmo Marconi"

Academic discipline: ING-INF/01 Electronic Engineering

Publications

Raffo A.; Santarelli A.; Traverso P. A.; Pagani M.; Vannini G.; Filicori F., Accurate modeling of electron device I/V characteristics through a simplified large-signal measurement setup, «INTERNATIONAL JOURNAL OF RF AND MICROWAVE COMPUTER-AIDED ENGINEERING», 2005, 15, pp. 441 - 452 [Scientific article]

Raffo A.; Santarelli A.;Traverso P. A.; Vannini G.; Palomba F.; Scappaviva F.; Pagani M.; Filicori F., Accurate PHEMT Intermodulation Prediction in the Presence of Low-Frequency Dispersion Effects, «IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES», 2005, 53, pp. 3449 - 3459 [Scientific article]

P. A. Traverso; A. Raffo; M. Pirazzini; A. Santarelli; F. Filicori, Automated Microwave Device Characterization Set-Up Based on a Technology-Independent Generalized Bias System, in: Proceedings IEEE Instrumentation and Measurement Technology Conference (IMTC’05), OTTAWA, IEEE Instrumentation and Measurement Society, 2005, pp. 457 - 462 (atti di: IEEE Instrumentation and Measurement Technology Conference (IMTC’05), Ottawa (Canada), May 2005) [Contribution to conference proceedings]

Raffo A.; Lonac J. A.; Resca D.; Monaco S.; Santarelli A. ;Vannini G., Comparison of Electron Device Models Based on Operation-specific Metrics, in: IEEE Proceedings of the 17th Asia Pacific Microwave Conference, s.l, IEEE Microwave Theory and Techniques Society, 2005, 4, pp. 2411 - 2414 (atti di: IEEE 17th Asia Pacific Microwave Conference, Suzhou, China, 4-7 Dec. 2005) [Contribution to conference proceedings]

SANTARELLI A.; PAGANELLI R., Critical Issues in Highly-Linear Power Amplifier Design, in: 2005 IEEE CSIC Symposium Technical Digest, s.l, IEEE Microwave Theory and Techniques Society, 2005, pp. 57 - 60 (atti di: 2005 IEEE Compound Semiconductor IC Symposium, Palm Springs, California, USA, 30 Oct. - 2 Nov. 2005) [Contribution to conference proceedings]

Resca D.; Cignani R.; Raffo A.; Santarelli A.; Vannini G., Implementation of non-conventional nonlinear models for electron devices in commercial CAD tools, in: European Microwave Week (2005) - Conference Proceedings, NORWOOD (MA), horizon house, 2005, pp. 445 - 448 (atti di: 13th Gallium Arsenide and other Compound Semiconductors Application Symposium, Paris (France), 3-7 Oct. 2005) [Contribution to conference proceedings]

A. Raffo; A. Santarelli; P. A. Traverso; M. Pagani; F. Palomba; F. Scappaviva; G. Vannini; F. Filicori, Improvement of PHEMT Intermodulation Prediction Through the Accurate Modelling of Low-Frequency Dispersion Effects, in: Proceedings of IEEE 2005 MTT-S International Microwave Symposium, LONG BEACH (CA), IEEE Microwave Theory and Techniques Society, 2005, pp. - - - (atti di: IEEE 2005 MTT-S International Microwave Symposium, Long Beach (CA) USA, Jun. 2005) [Contribution to conference proceedings]

A. Raffo; A. Santarelli; P. A. Traverso; G. Vannini; F. Filicori, Simplified Validation of Non-Linear Models for Micro- and Millimeter-Wave Electron Devices, in: Proceedings of European Microwave Week, GAAS’05, PARIS, GAAS Association, 2005, pp. 201 - 204 (atti di: European Microwave Week, GAAS’05, Paris (France), Oct. 2005) [Contribution to conference proceedings]

A. Raffo; A. Santarelli; P. A. Traverso; G. Vannini; F. Filicori, Small-Signal Operation-Based Simplified Verification of Non-Linear Models for Millimeter-Wave Electron Devices, in: Proceedings of IEEE 2005 MTT-S ARFTG 65th Conference, LONG BEACH (CA), IEEE Microwave Theory and Techniques Society, 2005, pp. 144 - 148 (atti di: IEEE 2005 MTT-S ARFTG 65th Conference, Long Beach (CA) USA, May 2005) [Contribution to conference proceedings]

FLORIAN C.; PIRAZZINI M.; VANNINI G.; SANTARELLI A.; BORGARINO M.; ANGELONE C.; PAPARO M.; FILICORI F., C Band DROs Using Microwave Bipolar Devices: Nonlinear Design Technique and Noise Model for Phase Noise Prediction, in: European Microwave Week 2004 - Conference Proceedings, NORWOOD (MA), Horizon House, 2004, pp. 41 - 44 (atti di: GAAS2004, Gallium Arsenide Applications Symposium, Amsterdam - The Netherlands, 11-15 Oct 2004) [Contribution to conference proceedings]

A. Raffo; A. Santarelli; M. Pagani; P. A. Traverso; G. Vannini, Modelling of PHEMT Low-Frequency I/V Characteristics Through a New Large-Signal Measurement Setup, in: Proceedings of INMMIC 2004, Integrated Non-linear Microwave and Millimetrewave Circuits Workshop, ROME, TEXMAT, 2004, pp. 23 - 26 (atti di: INMMIC 2004, Integrated Non-linear Microwave and Millimetrewave Circuits Workshop, Rome (Italy), Nov. 2004) [Contribution to conference proceedings]

A. Alabadelah; T. Fernandez; A. Mediavilla; B. Nauwelaers; A. Santarelli; D. Schreurs; A. Tazón; P. A. Traverso, Nonlinear models of microwave power devices and circuits, in: Proceedings of European Microwave Week, GAAS04, AMSTERDAM, GAAS Association, 2004, pp. 191 - 194 (atti di: European Microwave Week, Gallium Arsenide and other Compound Semiconductors Application Symposium, Amsterdam (The Netherlands), Oct. 2004) [Contribution to conference proceedings]

Lonac J.A.; Santarelli A.; Paganelli R.; Filicori F., Numerically efficient design of highly linear microwave power amplifiers, in: European Microwave Week 2004 - Conference Proceedings, NORWOOD (MA), Horizon House, 2004, pp. 17 - 20 (atti di: 34th European Microwave Conference, Amsterdam (The Netherlands), 11-15 Oct. 2004) [Contribution to conference proceedings]

A. Raffo; A. Santarelli; P. A. Traverso; G. Vannini; F. Filicori, On-Wafer I/V Measurement Setup for the Characterization of Low-Frequency Dispersion in Electron Devices, in: Proceedings of IEEE 2004 MTT-S ARFTG 63rd Conference, NEW YORK, IEEE Microwave Theory and Techniques Society, 2004, pp. 21 - 28 (atti di: IEEE 2004 MTT-S ARFTG 63rd Conference, Fort Worth (TX, USA), Jun. 2004) [Contribution to conference proceedings]

Santarelli A.; Paganelli R.; Costantini A.; Vannini G.; Filicori F., A simplified approach for quasi-linear power amplifier distortion evaluation, in: Conference Proceedings - 33rd European Microwave Conference, EuMC 2003, IEEE Computer Society, 2003, 1, pp. 387 - 390 (atti di: 33rd European Microwave Conference, EuMC 2003, Munich, deu, 2003) [Contribution to conference proceedings]

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