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Giorgio Cortelli

Research fellow

Department of Physics and Astronomy "Augusto Righi"

Research

Keywords: Atomic Force Microscopy (AFM) Nanoindentation Multilayered Materials Numerical Simulation of Nanoindentation 3D Microelectrode Arrays Soft Bioelectronic Interfaces

  • Study of the mechanical and electrical properties of multilayer materials through nanoindentation tests (AFM)
  • Development of numerical models based on the finite element method to interpret the experimental tests and extract the mechanical properties of the individual layers that make up the sample.
  • Study of the mechanical and electrical properties of 3D microelectrodes array with AFM.

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